Publications
Affichage de 15691 à 15700 sur 16261
Harmonic C-scan imaging by means of nonlinear finite amplitude phase conjugate ultrasonic waves
Y. Pyl'Nov, Philippe Pernod, Vladimir Preobrazhensky
2000, pp.835-838. ⟨hal-00158462⟩
Ridged waveguide to microstrip transition for electromagnetic characterization of materials in V-band.
J. Hinojosa, J.F. Kruck, Gilles Dambrine
Electronics Letters, 2000, 36, pp.1468-1470. ⟨hal-00158472⟩
Theoretical analysis of signal reflections on Cu on-chip interconnections
Denis Deschacht, Fabrice Huret, Gregory Servel, Erick Paleczny, P. Kennis
Proceedings of the 4th IEEE Workshop on Signal Propagation on Interconnects, 2000, Titisee-Neustadt, Germany. ⟨hal-00158592⟩
Fabrication process of shape memory alloy thin films for microactuation
I. Roch, L. Buchaillot, X. Wallart
Proceedings of the 2000 International Conference on Shape Memory and Superelastic Technologies, SMST-2000, 2000, Pacific Grove, CA, United States. ⟨hal-00158518⟩
Self-assembling of electrostatic micro-mirrors by means of integrated micro-actuators and mechanical latches
E. Quevy, L. Buchaillot, P. Bigotte, D. Collard
Proceedings of the 2nd International Workshop on Microfactories, IWMF 2000, 2000, Quebec, Canada. ⟨hal-00158522⟩
Anomalous behavior of coupling coefficient effect and spatial carrier density variation inside sampled grating DFB lasers
M.H. Mourad, Jean-Pierre Vilcot, Didier Decoster, D. Marcenac
2000, pp.215-225. ⟨hal-00158578⟩
Bipolar cathode transfered-electron device for millimeter wave generation
Christophe Dalle, M.R. Friscourt
Solid-State Electronics, 2000, 44, pp.79-84. ⟨hal-00158130⟩
Automated synthesis of current-memory cells
I. O'Connor, A. Kaiser
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2000, 19, pp.413-424. ⟨hal-00158504⟩
Modélisation des défauts étendus pour la diffusion transitoire accélérée du bore
E. Lampin, V. Senez, Alain Claverie
1ère Journée Nationale Impuretés et Défauts dans les Composants Ultimes, GDR Nanoélectronique : du silicium à la molécule, 2000, Orsay, France. ⟨hal-00158540⟩
Lithium niobate thick films grown by RF sputtering : correlation between optical analysis and transmission electron microscopy observations
X. Lansiaux, El Hadj Dogheche, Denis Remiens
Integrated Ferroelectrics, 2000, 31, pp.105-116. ⟨hal-00158553⟩