Publications
Affichage de 15701 à 15710 sur 16120
Millimeter-wave pulsed oscillator global modeling by means of electromagnetic, thermal, electrical and carrier transport physical coupled models
Stéphane Beaussart, Oliver Perrin, Marie-Renée Friscourt, Christophe Dalle
IEEE Transactions on Microwave Theory and Techniques, 1999, 47, pp.929-934. ⟨10.1109/22.769328⟩. ⟨hal-00005341⟩
Pulsed measurements of GaN MESFET
B. Boudart, S. Trassaert, Christophe Gaquière, Didier Theron, Y. Crosnier, Fabrice Huet, M.A. Poisson
GAAS 99, 1999, Munich, Germany. ⟨hal-01649413⟩
Metal-semiconductor-metal photodetectors
Joseph Harari, Jean-Pierre Vilcot, Didier Decoster
Wiley Encyclopedia of Electrical and Electronics Engineering, Volume 12, Wiley, pp.561-577, 1999. ⟨hal-00132302⟩
Nanometer scale lithography on silicon, titanium and PMMA resist using scanning probe microscopy
Emmanuel Dubois, Jean-Luc Bubbendorff
Solid-State Electronics, 1999, 43 (6), pp.1085-1089. ⟨10.1016/S0038-1101(99)00029-5⟩. ⟨hal-04246744⟩
Electromagnetic waves in finite superlattices with buffer and cap layers
M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski, M. Hammouchi, E. El Boudouti, A. Nougaoui
Journal of the Optical Society of America. A Optics, Image Science, and Vision, 1999, 16 (7), pp.1703. ⟨10.1364/JOSAA.16.001703⟩. ⟨hal-04070498⟩
Transferred InP-based HBVs on glass substrate
S. Arscott, P. Mounaix, D. Lippens
Electronics Letters, 1999, 35 (17), pp.1493. ⟨10.1049/el:19990984⟩. ⟨hal-02348069⟩
Large signal and pulse instabilities in GaN HFETs
Erhard Kohn, E Strobel, I. Daumiller, Christophe Gaquière, B. Boudart, Didier Theron, N.X. Nguyen, C.N. Nguyen
1st Gallium Nitride Electronic Device Workshop, 1999, Cornell, United States. ⟨hal-01654323⟩
High-frequency four noise parameters of silicon-on-insulator-based technology MOSFET for the design of low-noise RF integrated circuits
Gilles Dambrine, J.-P. Raskin, Francois Danneville, D. Vanhoenackel Janvier, J.-P. Colinge, A. Cappy
IEEE Transactions on Electron Devices, 1999, 46 (8), pp.1733-1741. ⟨10.1109/16.777164⟩. ⟨hal-03612809⟩
Trap effects studies in GaN MESFETs by pulsed measurements
S. Trassaert, B. Boudart, Christophe Gaquière, Didier Theron, Y. Crosnier, F. Huet, M.A. Poisson
Electronics Letters, 1999, 35 (16), ⟨10.1049/el:19990887⟩. ⟨hal-01647642⟩
Développement d’une attaque chimique sélective entre GaAs et Al0.22Ga0.78As et application au creusement du fossé de grille d’un TEC de puissance
X. Hue, B. Boudart, Y. Crosnier
7es Journées Nationales Microélectronique et Optoélectronique (JNMO), 1999, Egat, France. ⟨hal-01654470⟩