Publications

• Article dans une revue

Microscopic characterization of defects using scanning tunneling microscopy

D. Stievenard

Materials Science and Engineering: B, 2000, B71, pp.120-127. ⟨hal-00158667⟩

• Article dans une revue

Method for tight-binding parametrization : application to silicon nanostructures

Yann-Michel Niquet, Christophe Delerue, Guy Allan, Michel Lannoo

We propose a method for tight-binding parametrization, designed to give accurate results in the calculation of confined edge states in semiconductor nanostructures of any size. Indeed, this improved tight-binding description accurately reproduces the bulk effective masses as well as the overall…

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2000, 62, pp.5109-5116. ⟨10.1103/PhysRevB.62.5109⟩. ⟨hal-00158664⟩

• Article dans une revue

Atomic-scale study of GaMnAs/GaAs

B. Grandidier, J.P. Nys, C. Delerue, D. Stievenard, Y. Higo, M. Tanaka

Applied Physics Letters, 2000, 77, pp.4001-4003. ⟨hal-00158645⟩

• Article dans une revue

Vector and parallel implementations for the FDTD analysis of millimeter wave planar antennas

H. Hoteit, Ronan Sauleau, B. Philippe, Philippe Coquet, J.P. Daniel

International Journal of High Speed Computing, 1999, 10 (2), 209-234 - 25 p. ⟨hal-00557655⟩

• Communication dans un congrès

Nano-lithography by SPM-induced oxidation: role of space charge in the kinetics of oxide growth

Emmanuel Dubois, Jean-Luc Bubendorff

Proc. of the International Semiconductor Device Research Symposium ISDRS’99, Dec 1999, Charlottesville, United States. ⟨hal-04249195⟩

• Article dans une revue

Role of the defect microstructure on the electrical transport properties in undoped and Si-doped GaN grown by LP-MOVPE

J.-L Farvacque, Z. Bougrioua, I Moerman, G. van Tendeloo, O. Lebedev

Physica B: Condensed Matter, 1999, 273-274, pp.140-143. ⟨10.1016/S0921-4526(99)00431-7⟩. ⟨hal-02906481⟩

• Article dans une revue

Uniformity improvement of linear power pHEMTs using a very high selective wet etching

X. Hue, B. Boudart, B. Bonte, Y. Crosnier

The realization and characterization of Al0.22Ga0.78As/In0.22Ga0.78As/GaAs multifinger linear power pHEMTs, using a citric acid selective wet etching for the gate recessing, are reported. A very high uniformity for both the drain current and pinch-off voltage values have been obtained. The…

Microwave and Optical Technology Letters, 1999, 23 (3), pp.192 - 194. ⟨10.1002/(SICI)1098-2760(19991105)23:33.0.CO;2-5⟩. ⟨hal-01646851⟩

• Communication dans un congrès

Transducteurs optomillimétriques en filière InP pour réseaux locaux courte portée interfacés au réseau fibre optique

J. Barrette, Christophe Dalle, Didier Decoster, Manuel Fendler, Marie-Renée Friscourt, Jean-Philippe Gouy, Joseph Harari, Vincent Magnin, Francis Mollot, Paul-Alain Rolland, Jean-Pierre Vilcot

Bilan du programme CNRS-TELECOM, Nov 1999, Paris, France. ⟨hal-04457984⟩

• Article dans une revue

Mobility Collapse in Undoped and Si‐Doped GaN Grown by LP‐MOVPE

Zahia Bougrioua, J.-L Farvacque, Ingrid Moerman, Piet Demeester, J.J. Harris, K Lee, Gustaaf van Tendeloo, Oleg Lebedev, E. J. Thrush

physica status solidi (b), 1999. ⟨hal-02906475⟩

• Article dans une revue

Interpretation of the Temperature‐Dependent Transport Properties of GaN/Sapphire Films Grown by MBE and MOCVD

J.J. Harris, K Lee, I. Harrison, L. B. Flannery, D. Korakakis, T. S. Cheng, C. T. Foxon, Z. Bougrioua, I. Moerman, W. van Der Stricht, E. J. Thrush, B. Hamilton, K. Ferhah

Electron transport in Si‐doped and unintentionally‐doped GaN films grown on sapphire by MOCVD and MBE has been analysed assuming that a parallel conducting channel, via an impurity band, is present. No dependence on growth method or dopant type was observed, but other trends were apparent: a) the…

Physica Status Solidi A (applications and materials science), 1999. ⟨hal-02906478⟩