Publications
Affichage de 15751 à 15760 sur 16549
Microscopic characterization of defects using scanning tunneling microscopy
D. Stievenard
Materials Science and Engineering: B, 2000, B71, pp.120-127. ⟨hal-00158667⟩
Microtechnologies for the monolithic fabrication of mm and submm nonlinear devices
P. Mounaix, S. Arscott, T. David, Florence Podevin, X. Melique, D. Lippens
2000, pp.28-31. ⟨hal-00158204⟩
High Q InP-based varactor diodes
T. David, P. Mounaix, X. Melique, F. Mollot, O. Vanbésien, M. Chaubet, D. Lippens
Proceedings of the 11th International Symposium on Space Terahertz Technology, 2000, Ann Arbor, MI, United States. ⟨hal-00158223⟩
Détection par micro-ondes de défauts dans les matériaux diélectriques
D. Glay, T. Lasri, A. Mamouni, Y. Leroy
6èmes Journées Caractérisation Microondes et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158162⟩
Towards terahertz circuits via InP micromachining techniques
S. Arscott, T. David, X. Melique, P. Mounaix, D. Lippens
2000, pp.561-564. ⟨hal-00158203⟩
Resonant and localized electromagnetic modes in finite superlattices
M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski
Physical Review B, 2000, 61 (3), pp.2059-2064. ⟨10.1103/PhysRevB.61.2059⟩. ⟨hal-04070077⟩
Finite element modeling of damping using piezoelectric materials
Anne-Christine Hladky, C. Granger
2000, pp.64-65. ⟨hal-00157823⟩
Strong isotope effects in the UV light-induced reactivation of dopants in hydrogenated or deuterated n-GaAs : Si
Jacques Chevallier, M. Barbe, M. Constant, D. Bernard-Loridant, S. Silvestre, E. Constant
Superlattices and Microstructures, 2000, 27, pp.447-452. ⟨hal-00158584⟩
Formation of silicon islands on a silicon on insulator substrate upon thermal annealing
Bernard Legrand, Vincent Agache, Jean-Philippe Nys, Vincent Senez, Didier Stiévenard
Applied Physics Letters, 2000, 76, pp.3271-3273. ⟨10.1063/1.126603⟩. ⟨hal-00158537⟩
Design and simulation of a dual mode semiconductor laser using sampled grating DFB structure
M. Hussein-Mourad, Jean-Pierre Vilcot, Didier Decoster, D. Marcenac
IEE Proceedings. Optolectronics, 2000, 147, pp.37-42. ⟨hal-00158552⟩