Publications

• Article dans une revue

Analysis of the hot-carrier degradation of deep-submicrometer large-angle-tilt-implanted drain (LATID) MOSFETs

Alain Bravaix, Dominique Vuillaume

The hot carrier degradation of large-angle-tilt implanted drain (LATID) and standard LDD N-MOSFETs has been investigated thoroughly using the combination of I-V characterization, charge-pumping and profiling of the damaged region. Although the LATID structure exhibits a good current drivability and…

Solid-State Electronics, 1997, Solid-State Electronics, 41 (9), pp.1293-1301. ⟨10.1016/S0038-1101(97)00074-9⟩. ⟨hal-03023007⟩

• Article dans une revue

Acoustic band gaps in fibre composite materials of boron nitride structure

Jerome O. Vasseur, J Vasseur, Bahram Djafari-Rouhani, L. Dobrzynski, P Deymier

Journal of Physics: Condensed Matter, 1997, 9 (35), pp.7327-7341. ⟨10.1088/0953-8984/9/35/008⟩. ⟨hal-03301309⟩

• Chapitre d'ouvrage

Mesures en radiofréquences

A. Pacaud, Gilles Dambrine

Techniques de l'Ingénieur, Collection Méthodes de Mesures, Editions TI Sciences et Techniques, Paris, France, dossier R1135, papier RE2, 1997. ⟨hal-00131705⟩

• Article dans une revue

Metalorganic vapor phase epitaxy of coherent self-assembled InAs nanometer-sized islands in InP(001)

H. Marchand, P. Desjardins, S. Guillon, J.-E. Paultre, Z. Bougrioua, R. Y.-F. Yip, R. Masut

Applied Physics Letters, 1997, 71 (4), pp.527-529. ⟨10.1063/1.119609⟩. ⟨hal-02415062⟩

• Communication dans un congrès

Field Induced Oxidation of (100) Silicon Surfaces with coated AFM tip: a quantitative study

Didier Stiévenard, Paul-Aymeric Fontaine, Emmanuel Dubois

Proceedings of the 9th International Conference on Scanning Tunneling Microscopy, STM’97, Jul 1997, Hamburg, Germany. ⟨hal-04249069⟩

• Article dans une revue

Sequence-specific epigenetic effects of the maternal somatic genome on developmental rearrangements of the zygotic genome in Paramecium primaurelia.

E. Meyer, A Butler, K Dubrana, S. Duharcourt, F. Caron

Molecular and Cellular Biology, 1997, 17 (7), pp.3589-3599. ⟨10.1128/mcb.17.7.3589⟩. ⟨hal-02147010⟩

• Communication dans un congrès

Anodic Oxidation of Silicon and Titanium based on Near Field Microscopy

Emmanuel Dubois, Paul-Aymeric Fontaine

Proceedings of the International Conference on Solid State Devices and Materials, SSDM’97, Jul 1997, Hamamatsu, Japan. ⟨hal-04249063⟩

• Proceedings/Recueil des communications

Study of edge-coupled waveguide InGaAs/InP heterojunction phototransistors for microwave applications

Vincent Magnin, Jérôme Vandecasteele, Joseph Harari, J.P. Gouy, Sophie Maricot, Jean-Pierre Vilcot, Didier Decoster

IEE Colloquium on Fibre Optics in Microwave Systems and Radio Access, IEE, pp.4-4, 1997, ⟨10.1049/ic:19970719⟩. ⟨hal-04445003⟩

• Communication dans un congrès

Nano-Lithography based on Silicon Oxidation using Scanning Probe Techniques

Paul-Aymeric Fontaine, Emmanuel Dubois, Didier Stiévenard

IEEE Silicon Nanoelectronics Workshop (SNW), Jun 1997, Kyoto, Japan. ⟨hal-04248467⟩

• Article dans une revue

A coupled I(V) and charge-pumping analysis of Stress Induced Leakage Currents in 5nm-thick gate oxides

D. Goguenheim, Alain Bravaix, D. Vuillaume, F. Mondon, P. Candelierd, M. Jourdaine, A. Meinertzhagen

Stress Induced Leakage Currents (SILC) are studied in 5 nm-thick oxides on both capacitors and N-MOSFET's after homogeneous FOWLER-NORDHEIM injections under high field stress (<9MV/cm) for both polarities and localized Hot-Carrier injections. Standard I(V) and high-frequency C(V) curves are…

Microelectronic Engineering, 1997, Microelectronic Engineering, 36 (1-4), pp.141-144. ⟨10.1016/S0167-9317(97)00035-X⟩. ⟨hal-03023026⟩