Publications

Affichage de 15791 à 15800 sur 16386


  • Article dans une revue

Simultaneous generation of longitudinal and shear bulk ultrasonic waves in solids

Jean-Michel Rouvaen, Atika Rivenq, P. Logette, Philippe Goutin, F. Haine

Journal of Physics D: Applied Physics, 2000, 33, pp.1287-1297. ⟨hal-00159053⟩

  • Article dans une revue

Study in a UHF electromagnetic resonant cavity of a bubble field induced by ultrasonic cavitation

S. Labouret, J. Frohly

European Physical Journal: Applied Physics, 2000, 10, pp.231-237. ⟨hal-00159067⟩

  • Communication dans un congrès

On 2D/3D numerical oxidation modeling : calibration and investigation of silicon crystal orientation effect on stresses in shallow trench isolations

T. Hoffmann, K.F. Dombrowski, V. Senez

2000, pp.59-62. ⟨hal-00158513⟩

  • Communication dans un congrès

Microsysteme : un état des lieux, enjeux et perspectives

D. Collard, L. Buchaillot, Bernard Legrand

48èmes Journées Nationales de l'Union des Physiciens, 2000, Lille, France. ⟨hal-00158538⟩

  • Communication dans un congrès

Microsystème : enjeux et perspectives

D. Collard, L. Buchaillot, Bernard Legrand

Journée IMAPS : International Microelectronics and Packaging Society, 2000, Lille, France. ⟨hal-00158539⟩

  • Communication dans un congrès

Low cost PIC transceiver TO can modules fulfilling FSAN specifications

F. Mallecot, A. Leroy, F. Doukhan, Y. Arnaudin, Joseph Harari, Didier Decoster, F. Laune

2000, pp.aer 86. ⟨hal-00158606⟩

  • Article dans une revue

Imaging the wave function amplitudes in cleaved semiconductor quantum boxes

B. Grandidier, Y.M. Niquet, Bernard Legrand, J.P. Nys, C. Priester, D. Stievenard, J.M. Gerard, V. Thierry-Mieg

Physical Review Letters, 2000, 85, pp.1068-1071. ⟨hal-00158644⟩

  • Communication dans un congrès

Scanning tunneling microscopy based lithography in UHV

J.P. Nys, Thierry Melin, B. Grandidier, D. Stievenard

5th MEL-ARI/NID Workshop, 2000, Pise, Italy. ⟨hal-00158944⟩

  • Communication dans un congrès

Nature of impurity states in amorphous silicon

Guy Allan, Christophe Delerue, Michel Lannoo

CECAM Workshop on Electronic and Optical Properties of Semiconducting Glasses, 2000, Lyon, France. ⟨hal-00158966⟩