Publications

• Communication dans un congrès

Pulsed measurements of GaN MESFET

B. Boudart, S. Trassaert, Christophe Gaquière, Didier Theron, Y. Crosnier, Fabrice Huet, M.A. Poisson

GAAS 99, 1999, Munich, Germany. ⟨hal-01649413⟩

• Chapitre d'ouvrage

Metal-semiconductor-metal photodetectors

Joseph Harari, Jean-Pierre Vilcot, Didier Decoster

Wiley Encyclopedia of Electrical and Electronics Engineering, Volume 12, Wiley, pp.561-577, 1999. ⟨hal-00132302⟩

• Article dans une revue

High-frequency four noise parameters of silicon-on-insulator-based technology MOSFET for the design of low-noise RF integrated circuits

Gilles Dambrine, J.-P. Raskin, Francois Danneville, D. Vanhoenackel Janvier, J.-P. Colinge, A. Cappy

IEEE Transactions on Electron Devices, 1999, 46 (8), pp.1733-1741. ⟨10.1109/16.777164⟩. ⟨hal-03612809⟩

• Communication dans un congrès

Large signal and pulse instabilities in GaN HFETs

Erhard Kohn, E Strobel, I. Daumiller, Christophe Gaquière, B. Boudart, Didier Theron, N.X. Nguyen, C.N. Nguyen

1st Gallium Nitride Electronic Device Workshop, 1999, Cornell, United States. ⟨hal-01654323⟩

• Article dans une revue

Transferred InP-based HBVs on glass substrate

S. Arscott, P. Mounaix, D. Lippens

Electronics Letters, 1999, 35 (17), pp.1493. ⟨10.1049/el:19990984⟩. ⟨hal-02348069⟩

• Article dans une revue

Electromagnetic waves in finite superlattices with buffer and cap layers

M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski, M. Hammouchi, E. El Boudouti, A. Nougaoui

Journal of the Optical Society of America. A Optics, Image Science, and Vision, 1999, 16 (7), pp.1703. ⟨10.1364/JOSAA.16.001703⟩. ⟨hal-04070498⟩

• Article dans une revue

Nanometer scale lithography on silicon, titanium and PMMA resist using scanning probe microscopy

Emmanuel Dubois, Jean-Luc Bubbendorff

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) nanolithography techniques based on local oxidation of silicon/titanium and electron beam exposure of PMMA are described. It is shown that a 10 nm resolution can routinely be achieved using tapping-mode AFM-based anodization of…

Solid-State Electronics, 1999, 43 (6), pp.1085-1089. ⟨10.1016/S0038-1101(99)00029-5⟩. ⟨hal-04246744⟩

• Article dans une revue

Trap effects studies in GaN MESFETs by pulsed measurements

S. Trassaert, B. Boudart, Christophe Gaquière, Didier Theron, Y. Crosnier, F. Huet, M.A. Poisson

Electronics Letters, 1999, 35 (16), ⟨10.1049/el:19990887⟩. ⟨hal-01647642⟩

• Communication dans un congrès

Développement d’une attaque chimique sélective entre GaAs et Al0.22Ga0.78As et application au creusement du fossé de grille d’un TEC de puissance

X. Hue, B. Boudart, Y. Crosnier

7es Journées Nationales Microélectronique et Optoélectronique (JNMO), 1999, Egat, France. ⟨hal-01654470⟩

• Article dans une revue

Influence of the Source Inductance Parasitic Effect on the Conversion Gain of the HEMT Gate Mixer

Rachid Allam, Christophe Kolanowski, Jean-Marie Paillot, Claude Duvanaud, Y. Crosnier

This paper examines the influence of the presence of source inductance on the conversion gain of a gate mixer. Two effects are observed: degradation of the gain, and an increase of the local oscillator level power necessary to obtain the maximum gain. Nonlinear simulations, theoretical calculations…

Microwave and Optical Technology Letters, 1999, 22 (3), pp.149--151. ⟨10.1002/(SICI)1098-2760(19990805)22:33.0.CO;2-K⟩. ⟨hal-03360876⟩