Publications

Affichage de 15911 à 15920 sur 16095


  • Communication dans un congrès

Growth of low temperature GaAs on GaAs under different conditions

Didier Theron, B. Boudart, R. Westphalen, Xavier Wallart, Y. Druelle

3rd European Workshop on Heterostructure Technology (HETECH), 1993, Villeneuve d'Ascq, France. ⟨hal-01654281⟩

  • Communication dans un congrès

The theory of rare-earth impurities in semiconductors

Christophe Delerue, Michel Lannoo

MRS 1993 Spring Meeting, 1993, San Francisco, United States. ⟨hal-03316744⟩

  • Article dans une revue

Helena: A friendly software for calculating the DC, AC, and noise performance of HEMTs

Henri Happy, Gilles Dambrine, Jocelyn Alamkan, Francois Danneville, François Kaptche-Tagne, A. Cappy

International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering, 1993, 3 (1), pp.14-28. ⟨10.1002/mmce.4570030105⟩. ⟨hal-03317740⟩

  • Chapitre d'ouvrage

DISPERSION OF LONGITUDINAL ULTRASONIC WAVE VELOCITY THROUGH CARBON-EPOXY COMPOSITE MATERIALS.

Mohamed Ourak, Mohammadi Ouaftouh, Jean-Michel Rouvaen, Bertrand Nongaillard, C. Bruneel

Ultrasonics International 93, Elsevier, pp.435-438, 1993, ⟨10.1016/b978-0-7506-1877-9.50108-6⟩. ⟨hal-03811463⟩

  • Communication dans un congrès

Temperature measurements of LT-GaAs diodes

R. Westphalen, B. Boudart, Didier Theron, Xavier Wallart, Y. Druelle, Y. Crosnier

European Materials Research Society, 1993, Strasbourg, France. ⟨hal-01648117⟩

  • Article dans une revue

Effect of the character of high-angle grain boundaries on segregation: An elastic model

Jerome O. Vasseur, P.A. Deymier

Interface Science, 1993, 1 (2), ⟨10.1007/BF00203601⟩. ⟨hal-03301130⟩

  • Article dans une revue

A new method for on wafer noise measurement

Gilles Dambrine, H. Happy, Francois Danneville, A. Cappy

IEEE Transactions on Microwave Theory and Techniques, 1993, 41 (3), pp.375-381. ⟨10.1109/22.223734⟩. ⟨hal-03317745⟩

  • Communication dans un congrès

The theory of rare-earth impurities in semiconductors

Christophe Delerue, Michel Lannoo, Guy Allan

17th International Conference on Defects in Semiconductors, 1993, Gmunden, Austria. ⟨hal-03316748⟩