Publications

Affichage de 3201 à 3210 sur 16104


  • Article dans une revue

Van Hove singularities and trap states in two-dimensional CdSe nanoplatelets

Nemanja Peric, Yannick Lambert, Shalini Singh, Ali Hossain Khan, Nathali Alexandra Franchina Vergel, D. Deresmes, Maxime Berthe, Zeger Hens, Iwan Moreels, Christophe Delerue, B. Grandidier, Louis Biadala

Semiconductor nanoplatelets, which offer a compelling combination of the flatness of two-dimensional semiconductors and the inherent richness brought about by colloidal nanostructure synthesis, form an ideal and general testbed to investigate fundamental physical effects related to the…

Nano Letters, 2021, 21 (4), pp.1702-1708. ⟨10.1021/acs.nanolett.0c04509⟩. ⟨hal-03152599⟩

  • Communication dans un congrès

Non-linear analysis of a broadband power amplifier at 300 GHz

Haitham Ghanem, Benjamin Schoch, Ingmar Kallfass, P. Szriftgiser, Malek Zegaoui, Mohammed Zaknoune, Francois Danneville, Guillaume Ducournau

In this article we present a new method to measure the third-order intercept point (IP3) of a 300 GHz medium power amplifier MMIC based on III-V technology in an on-wafer measurement setup. The extraction was carried out using a uni-travelling carrier photodiode as the input signal source. Taking…

15th European Microwave Integrated Circuits Conference, Session EuMIC12 - Design and Characterisation Techniques,, Jan 2021, Utrecht, Netherlands. pp.209-212. ⟨hal-03348195⟩

  • Communication dans un congrès

Back gate impact on the noise performances of 22FDX fully-depleted SOI CMOS

Ousmane Magatte Kane, Luca Lucci, Pascal Scheiblin, Thierry Poiroux, Jean-Charles Barbé, Francois Danneville

Ultra-Thin-Body and Back-oxide Fully-Depleted Silicon-On-Insulator (UTBB-FDSOI) MOSFETs are the most recent and advanced Silicon-On-Insulator (SOI) architecture proposed to overcome the down-scaling limitations of traditional bulk devices. The UTBB-FDSOI architecture has already been proved very…

15th European Microwave Integrated Circuits Conference, EuMIC 2020, Jan 2021, Utrecht, Netherlands. 81-84, https://ieeexplore.ieee.org/abstract/document/9337333. ⟨hal-03462849⟩

  • Article dans une revue

High-Q silicon nitride drum resonators strongly coupled to gates

Xin Zhou, Srisaran Venkatachalam, Ronghua Zhou, Hao Xu, Alok Pokharel, Andrew Fefferman, Mohammed Zaknoune, Eddy Collin

Silicon nitride (SiN) mechanical resonators with high quality mechanical properties are attractive for fundamental research and applications. However, it is challenging to maintain these mechanical properties while achieving strong coupling to an electrical circuit for efficient on-chip integration…

Nano Letters, 2021, 21 (13), pp.5738-5744. ⟨10.1021/acs.nanolett.1c01477⟩. ⟨hal-03263144⟩

  • Communication dans un congrès

An advanced ageing methodology for robustness assessment of normally-off AlGaN/GaN HEMT

F. Albany, A. Curutchet, N. Labat, F. Lecourt, E. Walasiak, H. Maher, Y. Cordier, N. Defrance, N. Malbert

The semi-on-state reliability of normally-off AlGaN/GaN high electron mobility transistor fabricated by fluorine ion plasma implantation technology is reported, focusing on an advanced dc step-stress methodology. By inserting a non-stressful fixed-bias step between each stress step, a reliable in-…

15th European Microwave Integrated Circuits Conference, EuMIC 2020, Jan 2021, Utrecht, Netherlands. 237-240, https://ieeexplore.ieee.org/abstract/document/9337362. ⟨hal-03362260⟩