Publications

Affichage de 4521 à 4530 sur 16059


  • COMM

High voltage GaN-on-silicon with low-trapping up to 1200 V

Alaleh Tajalli, Idriss Abid, Riad Kabouche, Malek Zegaoui, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, A Nishikawa, F Medjdoub

International Workshop on Nitride Semiconductors, Nov 2018, Kanazawa, Japan. ⟨hal-03288133⟩

  • COMM

Filtres acousto-optique pour l’imagerie hyperspectrale et spectro-polarimétrique

Samuel Dupont, Justine Champagne, Jean-Claude Kastelik, Joseph Gazalet

Journée Co-conception : capteurs hybrides et algorithmes pour des systèmes innovants, GDR ISIS, Nov 2018, Paris, France. ⟨hal-04467466⟩

  • COMM

Actions du GIP-CNFM au sein du comité stratégique de filière

Virginie Hoel

15èmes Journées Pédagogiques du CNFM, JPCNFM 2018, CNFM, Nov 2018, Saint-Malo, France. ⟨hal-03340971⟩

  • ART

Mesoporous silica nanoparticles in recent photodynamic therapy applications

Bayir Sumeyra, Alexandre Barras, Rabah Boukherroub, Sabine Szunerits, Laurence Raehm, Sebastien Richeter, Jean-Olivier Durand

In this review, the use of mesoporous silica nanoparticles for photodynamic therapy (PDT) applications is described for the year 2017. Since the pioneering work in 2009, nanosystems involving mesoporous silica nanoparticles have gained in complexity with a sophisticated core–shell system able to…

Photochemical & Photobiological Sciences , 2018, 17 (11), pp.1651 - 1674. ⟨10.1039/C8PP00143J⟩. ⟨hal-01931185⟩

  • COMM

[Invited] Novel heterostructures for millimeter-wave GaN devices

R Pecheux, Riad Kabouche, Malek Zegaoui, F Medjdoub

Asia-Pacific Microwave Conference (APMC), Nov 2018, kyoto, Japan. ⟨hal-03287819⟩

  • COMM

Blistering of Al2O3/a-SiNx:H stacks: analysis of the submerged part of the iceberg by colored picosecond acoustic microscopy

Fabien Lebreton, Arnaud Devos, Etienne Drahi, Patricia de Coux, Francois Silva, Sergej Filonovich, Pere Roca I Cabarrocas

<div><p>Blistering of Al 2 O 3 /SiN X :H stacks has been regularly reported over the last decade. Despite several studies, it has not been possible to link blistering density and lifetime degradation. In this work we demonstrate the use APiC technique to probe the c-Si/Al 2 O 3…

2017 IEEE 44th Photovoltaic Specialists Conference (PVSC), Jun 2017, Washington DC, United States. pp.464-466, ⟨10.1109/PVSC.2017.8366749⟩. ⟨hal-04779794⟩