Publications
Affichage de 6031 à 6040 sur 16179
Broadband dielectric characterization of aqueous saline solutions by an interferometer-based microwave microscope
S. Gu, Tianjun Lin, T. Lasri
Applied Physics Letters, 2016, 108 (24), pp.242903. ⟨10.1063/1.4953629⟩. ⟨hal-03538486⟩
Inverse saffman-taylor experiments with particles lead to capillarity driven fingering instabilities
Ilyesse Bihi, Michael Baudoin, Jason E. Butler, Christine Faille, Farzam Zoueshtiagh
Physical Review Letters, 2016, 117 (3), ⟨10.1103/PhysRevLett.117.034501⟩. ⟨hal-02636447⟩
METASTABILITY OF FINITE STATE MARKOV CHAINS: A RECURSIVE PROCEDURE TO IDENTIFY SLOW VARIABLES FOR MODEL REDUCTION
Claudio Landim, T. Xu
ALEA : Latin American Journal of Probability and Mathematical Statistics, 2016. ⟨hal-01728594⟩
DS-UWB and TH-UWB Energy Consumption Comparison
Adil Elabboubi, Fouzia Elbahhar, Marc Heddebaut, Yassin El Hillali
Journal of Telecommunications and Information Technology, 2016, 2016 (1), pp.101-109. ⟨hal-01469836v2⟩
Magnetic-Phase Dependence of the Spin Carrier Mean Free Path in Graphene Nanoribbons
Jing Li, Yann-Michel Niquet, Christophe Delerue
Physical Review Letters, 2016, 116 (23), pp.236602. ⟨10.1103/PhysRevLett.116.236602⟩. ⟨cea-01849844⟩
AlN/IDT/AlN/Sapphire SAW Heterostructure for High-Temperature Applications
Ouarda Legrani, Thierry Aubert, Omar Elmazria, Ausrine Bartasyte, Pascal Nicolay, Abdelkrim Talbi, Pascal Boulet, Jaafar Ghanbaja, Denis Mangin
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 2016, 63 (6), pp.898 - 906. ⟨10.1109/TUFFC.2016.2547188⟩. ⟨hal-01525494⟩
Reliability assessment of ultra-short gate length AlGaN/GaN HEMTs on Si substrate by on-state step stress
Hadhemi Lakhdar, Nathalie Labat, Arnaud Curutchet, N. Defrance, Marie Lesecq, J.C. Dejaeger, Nathalie Malbert
Microelectronics Reliability, 2016. ⟨hal-01718762⟩
Containment nuclear plant structures evaluation by non destructive testing: strategy and results
Vincent Garnier, Jean-Marie Henault, Hamid Hafid, Jérôme Verdier, Jean François Chaix, Odile Abraham, Zoubir Medhi Sbartaï, Jean-Paul Balayssac, Bogdan Piwakowski, Géraldine Villain, Xavier Derobert, Cédric Payan, Sandrine Rakotonarivo, Éric Larose, Hognon Sogbossi, Quang Anh Vu, Martin Lott, Jean-Baptiste Legland, Olivier Durand, Radoslaw Drelich, Charles Ciccarone
TINCE 2016 3rd Conference on Technological Innovations in Nuclear Civil Engineering, Sep 2016, Paris, France. 13p. ⟨hal-01599552⟩
Toward Energy Profiling of Connected Embedded Systems
Nadir Cherifi, Gilles Grimaud, Alexandre Boé, Thomas Vantroys
NTMS 2016 - 8th IFIP International Conference on New Technologies, Mobility and Security , Nov 2016, Larnaca, Cyprus. pp.1 - 4, ⟨10.1109/NTMS.2016.7792483⟩. ⟨hal-01599164⟩
Above 2000 V breakdown voltage at 600 K GaN-on-silicon high electron mobility transistors
Nicolas Herbecq, Isabelle Roch-Jeune, Astrid Linge, Malek Zegaoui, Pierre-Olivier Jeannin, Nicolas Clément, Jean-Paul Rouger, F Medjdoub
Physica Status Solidi A (applications and materials science), 2016, 213 (4), pp.873--877. ⟨10.1002/pssa.201532572⟩. ⟨hal-02277752⟩