Publications

Affichage de 7251 à 7260 sur 16109


  • Communication dans un congrès

[Invited] ATILA++ update

Pascal Mosbah

66th ICAT/JTTAS Joint International Smart Actuator Symposium, 2013, State College, PA, United States. ⟨hal-01044823⟩

  • Communication dans un congrès

Enhanced gold film-coupled graphene-based plasmonic nanosensor

Rana Nicolas, Thomas Maurer, Julien Proust, Jérémie Béal, Silvere Schuermans, Edy Wijaya, Jean-Pierre Vilcot, Jerome Plain, Rabah Boukherroub, Pierre-Michel Adam, Sabine Szunerits, Gaëtan Lévêque, Abdellatif Akjouj, Bahram Djafari-Rouhani

Summer School of Plasmonics, SSOP3, 2013, Cargese, France. ⟨hal-01063873⟩

  • Proceedings/Recueil des communications

On Lagrangian in Maxwell's electromagnetic theory

Raffaele Pisano

Scientiarum Historia VI, The Federate University of Rio de Janeiro Press, pp.44-59, 2013, ISSN 2176-123X. ⟨hal-04517937⟩

  • Article dans une revue

On the Conceptual and Civilization Frames in Rene Descartes’s Physical Works

Paolo Bussotti, Raffaele Pisano

Advances in Historical Studies, 2013, 02 (03), pp.106-125. ⟨10.4236/ahs.2013.23015⟩. ⟨hal-04507881⟩

  • Autre publication scientifique

Advances in Historical Studies [Editor in Chief 2/2]

Raffaele Pisano

2013. ⟨hal-04511055⟩

  • Article dans une revue

Psyco-Education Factors of Applying Visualisation in Science Education [Ph.D Thesis Review]

Raffaele Pisano

Advances in Historical Studies, 2013, 02 (01), pp.17-18. ⟨10.4236/ahs.2013.21005⟩. ⟨hal-04509504⟩

  • Communication dans un congrès

Impact of the deposition process on the elastic properties of thin films measured by ultrafast acoustics

Arnaud Devos, A. Le Louarn, P. Emery

IEEE International Ultrasonics Symposium, IUS 2013, 2013, Prague, Czech Republic. ⟨hal-00944053⟩

  • Article dans une revue

First reliability demonstration of sub-200 nm AlN/GaN-on-silicon double heterostructure HEMTs for Ka band applications

G. Meneghesso, M. Meneghini, F Medjdoub, Y. Tagro, B. Grimbert, D. Ducatteau, N. Rolland, R. Silvestri, E. Zanoni

IEEE Transactions on Device and Materials Reliability, 2013, 13, pp.480-488. ⟨10.1109/TDMR.2013.2276425⟩. ⟨hal-00913577⟩