Publications

• Communication dans un congrès

Interferometric scanning microwave microscope for nanotechnology application

N. Clement, Thomas Dargent, H. Tanbakuchi, K. Nishiguchi, R. Sivakumarasamy, F. Wang, A. Fujiwara, D. Ducatteau, Gilles Dambrine, D. Vuillaume, Bernard Legrand, D. Theron

American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States. ⟨hal-00811777⟩

• Communication dans un congrès

Scanning gate spectroscopy of a quantum Hall island near a quantum point contact

B. Hackens, F. Martins, S. Faniel, V. Bayot, B. Rosenow, L. Desplanque, X. Wallart, M. Pala, H. Sellier, S. Huant

American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States. ⟨hal-00811773⟩

• Article dans une revue

Fundamentals of charged devices : energy changes in a capacitor medium

J.S. Young, Laurent Baudry

Capacitors and derivative devices continue to be as relevant as ever, both at the frontiers of scientific and technological research and in the development of commercial products. Central to such pursuits is the essential requirement that all aspects of the work done in charging or discharging…

EPL - Europhysics Letters, 2013, 101, pp.58001-1-5. ⟨10.1209/0295-5075/101/58001⟩. ⟨hal-00811707⟩

• Communication dans un congrès

Semiconductor nanodevices for room temperature THz detection and emission

J. Mateos, J.F. Millithaler, I. Iniguez-De-La-Torre, A. Iniguez-De-La-Torre, B.G. Vasallo, S. Perez, P. Sangare, Guillaume Ducournau, Christophe Gaquière, Y. Alimi, L. Zhang, A. Rezazadeh, A.M. Song, A. Westlund, J. Grahn, T. Gonzalez

International Workshop on Terahertz Science and Technology, OTST 2013, 2013, Kyoto, Japan. ⟨hal-00811823⟩

• Communication dans un congrès

Microwave evaluation performance of BST thin films with different orientations : application to a Hairpin filter

Denis Remiens, Freddy Ponchel, A. Ghalem, T. Lasri

3rd China-French Symposium on Advanced Materials, CFSAM-3, 2013, Bordeaux, France. ⟨hal-00811833⟩

• Communication dans un congrès

Laser ultrasonics and mode conversion for flaw depth gauging

Frédéric Faëse, Frédéric Jenot, Mohammadi Ouaftouh, Marc Duquennoy, Mohamed Ourak

Compared to earliest non destructive testing and evaluation methods based on transducers, laser ultrasonics shows specific advantages. It is a non-contact method combining a high spatial resolution and a large bandwidth, allowing high temperature and/or geometrically complex materials testing. In…

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII, 2013, Le Mans, France. paper 15509, 9 p. ⟨hal-00971600⟩

• Autre publication scientifique

Vers une électronique terahertz : contribution à la technologie des transistors III-V

Mohammed Zaknoune

2013. ⟨hal-00813614⟩

• Communication dans un congrès

InAlAs/InGaAa HEMTs on polyimide flexible substrate with high cut-off frequencies

J.S. Shi, Nicolas Wichmann, Yannick Roelens, S. Bollaert

Journées Nationales Technologies Emergentes en Micro-Nanofabrication, JNTE 2013, 2013, Evian, France. ⟨hal-00813609⟩

• Communication dans un congrès

Three-paths microwave interferometric system based on a six-port technique

Kamel Haddadi, T. Lasri

This paper presents a new type of six-port instrument to meet the specific needs of electrical characterization tools for impedances clearly different than the standard 50Ω reference impedance. A method is developed for the precise adjustment of the reference impedance of the measurement system to…

10th European Radar Conference, EuRAD 2013, and 43rd European Microwave Conference, EuMC 2013, European Microwave Week 2013, 2013, Nuremberg, Germany. paper EuMC/EuRAD02-5, 291-294. ⟨hal-00922398⟩

• Article dans une revue

Characterization of micrometric and superficial residual stresses using high frequency surface acoustic waves generated by interdigital transducers

Marc Duquennoy, Mohammadi Ouaftouh, J. Deboucq, Jean-Etienne Lefebvre, Frédéric Jenot, Mohamed Ourak

Journal of the Acoustical Society of America, 2013, 134, pp.4360-4371. ⟨10.1121/1.4826176⟩. ⟨hal-00916305⟩