Publications

Affichage de 8321 à 8330 sur 16378


  • Article dans une revue

Relay characteristic impact on energy consumption in heterogeneous sensor network

Jie Chen, A. Massouri, Laurent Clavier, Christophe Loyez, N. Rolland, P.A. Rolland

AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 2012, 66, pp.495-501. ⟨10.1016/j.aeue.2011.10.011⟩. ⟨hal-00786951⟩

  • Article dans une revue

Engineering the hypersonic phononic band gap of hybrid Bragg stacks

D. Schneider, F. Liaqat, E.H. El Boudouti, Y. El Hassouani, Bahram Djafari-Rouhani, W. Tremel, H.J. Butt, G. Fytas

Nano Letters, 2012, 12, pp.3101-3108. ⟨10.1021/nl300982d⟩. ⟨hal-00787474⟩

  • Article dans une revue

Receiver-aided predistortion of power amplifier non-linearities in cellular networks

J. Zeleny, C. Dehos, P. Rosson, A. Kaiser

IET Science Measurement and Technology, 2012, 6, pp.168-175. ⟨10.1049/iet-smt.2011.0016⟩. ⟨hal-00787384⟩

  • Article dans une revue

Supercritical dynamics of magnetoelastic wave triad in a solid

Vladimir Preobrazhensky, O. Yevstafyev, Philippe Pernod, Olivier Bou Matar, V. Berzhansky

Physics of Wave Phenomena, 2012, 20, pp.256-263. ⟨10.3103/S1541308X12040036⟩. ⟨hal-00787360⟩

  • Article dans une revue

Polymer-based zero-level packaging technology for high frequency RF applications by wafer bonding/debonding technique using an anti-adhesion layer

J.G. Kim, S. Seok, N. Rolland, P.A. Rolland

International Journal of Precision Engineering and Manufacturing, 2012, 13, pp.1861-1867. ⟨10.1007/s12541-012-0244-7⟩. ⟨hal-00786960⟩

  • Article dans une revue

The effect of gate length variation on InAlGaN/GaN HFET device characteristics

N. Ketteniss, H. Behmenburg, F. Lecourt, N. Defrance, Virginie Hoel, Jean-Claude de Jaeger, M. Heuken, H. Kalisch, A. Vescan

Semiconductor Science and Technology, 2012, 27, pp.035009-1-4. ⟨10.1088/0268-1242/27/3/035009⟩. ⟨hal-00788167⟩

  • Article dans une revue

High power density performances of SiGe HBT from BiCMOS technology at W-band

A. Pottrain, T. Lacave, D. Ducatteau, D. Gloria, P. Chevalier, Christophe Gaquière

IEEE Electron Device Letters, 2012, 33, pp.182-184. ⟨10.1109/LED.2011.2177631⟩. ⟨hal-00788168⟩