Publications

• Article dans une revue

Nanoscale study by piezoresponse force microscopy of relaxor 0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 and 0.9Pb(Mg1/3Nb2/3)O3-0.1PbTiO3 thin films grown on platinum and LaNiO3 electrodes

Mikaël Detalle, Anthony Ferri, Antonio Da Costa, Rachel Desfeux, Caroline Soyer, Denis Remiens

Thin Solid Films, 2010, 518, pp.4670-4674. ⟨10.1016/j.tsf.2009.12.056⟩. ⟨hal-00549914⟩

• Chapitre d'ouvrage

Electrostatic force microscopy and Kelvin force microscopy as a probe of the electrostatic and electronic properties of carbon nanotubes

Thierry Melin, Mariusz Zdrojek, David Brunel

This chapter addresses recent experimental studies on carbon nanotubes and nanotube devices using electrical techniques derived from atomic force microscopy. Electrostatic force microscopy (EFM), Kelvin force microscope (KFM), and their variants are introduced. We show how EFM-related techniques…

B. Bhushan. Scanning probe microscopy in nanoscience and nanotechnology, Springer, chapitre 4, 89-128, 2010, ⟨10.1007/978-3-642-03535-7_4⟩. ⟨hal-00575864⟩

• Article dans une revue

Development of Time-resolved UV Micro-Raman Spectroscopy to measure temperature in AlGaN/GaN HEMTs

Ophélie Lancry, Emmanuelle Pichonat, Julien Réhault, Myriam Moreau, Raphaël Aubry, Christophe Gaquière

We report on the development of Time-resolved Ultraviolet Micro-Raman Scattering to measure transient self-heating effects in semiconductor devices. Temperature measurements are performed on AlGaN/GaN High-electron-mobility transistors (HEMTs) grown on SiC substrate. Ultraviolet excitation probes…

Solid-State Electronics, 2010, 54, pp.1434 - 1437. ⟨10.1016/j.sse.2010.05.029⟩. ⟨hal-00514166⟩

• Article dans une revue

Materials selection procedure for RF-MEMS

G. Guisbiers, E. Herth, Bernard Legrand, N. Rolland, T. Lasri, L. Buchaillot

Microelectronic Engineering, 2010, 87, pp.1792-1795. ⟨10.1016/j.mee.2009.10.016⟩. ⟨hal-00549627⟩

• Article dans une revue

Wavelength and beam launching effects on silica optical fiber in local area networks

H. Mrabet, Iyad Dayoub, R. Attia, W. Hamouda

Optics Communications, 2010, 283, pp.4234-4241. ⟨10.1016/j.optcom.2010.06.034⟩. ⟨hal-00549472⟩

• Article dans une revue

Thermal behavior analysis of GaN based epi-material on different substrates by means of a physical-thermal model

Xing Tang, Michel Rousseau, N. Defrance, Virginie Hoel, A. Soltani, R. Langer, Jean-Claude de Jaeger

For gallium nitride (GaN) based microwave power devices, the thermal behavior due to the self-heating effect constitutes a main limitation because the power dissipation is very high. For this study, a predictive physical-thermalmodel has been developed to analyze the physical and thermal phenomena…

Physica Status Solidi A (applications and materials science), 2010, 207, pp.1820-1826. ⟨10.1002/pssa.200925321⟩. ⟨hal-00549464⟩

• Article dans une revue

Theoretical predictions of wurtzite III-nitride nano-materials properties

G. Guisbiers, D. Liu, Q. Jiang, L. Buchaillot

Physical Chemistry Chemical Physics, 2010, 12, pp.7203-7210. ⟨10.1039/c002496a⟩. ⟨hal-00548994⟩

• Article dans une revue

Two-terminal carbon nanotube programmable devices for adaptive architectures

Guillaume Agnus, Weisheng Zhao, Vincent Derycke, Arianna Filoramo, Y. Lhuillier, S. Lenfant, D. Vuillaume, C. Gamrat, J.P. Bourgoin

Carbon nanotube field-effect transistors functionalized with photoconducting polymer act as very efficient and non-volatile two-terminal programmable devices (see figure). Their optoelectronic programmability allows compensating for the critical issue of variability among as-built devices in…

Advanced Materials, 2010, 22, pp.702-706. ⟨10.1002/adma.200902170⟩. ⟨hal-00548986⟩

• Article dans une revue

Explosive instability of quasi-phonon triads in antiferromagnet under frequency modulated electromagnetic field

Vladimir Preobrazhensky, O. Yevstafyev, Philippe Pernod, V. Berzhansky

Journal of Magnetism and Magnetic Materials, 2010, 322, pp.585-588. ⟨10.1016/j.jmmm.2009.09.067⟩. ⟨hal-00548960⟩

• Article dans une revue

Unusual Curie point independence of thickness and interfacial properties for perfectly (111)-oriented Ba0.6Sr0.4TiO3 thin films

L.H. Yang, G.S. Wang, X.L. Dong, Denis Remiens

Journal of the American Ceramic Society, 2010, 93, pp.2526-2529. ⟨10.1111/j.1551-2916.2010.03877.x⟩. ⟨hal-00549533⟩