Publications
Affichage de 13941 à 13950 sur 16170
Nonlinear noise modeling in FETs for the design of low noise active mixers
Francois Danneville
IEEE MTT-S International Microwave Symposium, Workshop on System-Level Measurement, Modelling, and Design Issues of Mixers, 2004, Fort Worth, TX, United States. ⟨hal-00133911⟩
Technique de déconvolution aveugle appliquée au contrôle non destructif par micro-ondes
D. Glay, T. Lasri
PLACKO D., ORTEU J.J., LEPOUTRE F. Instrumentation - Aspects fondamentaux, Hermès, pp.189-196, 2004. ⟨hal-00132298⟩
Design optimization of AlInAs-GaInAs HEMTs for high frequency applications
J. Mateos, T. Gonzales, D. Pardo, S. Bollaert, T. Parenty, A. Cappy
IEEE Transactions on Electron Devices, 2004, 51, pp.521-528. ⟨hal-00133866⟩
Influence of a tunneling gate current on the noise performance of SOI MOSFETs
G. Pailloncy, B. Iniguez, Gilles Dambrine, Francois Danneville
2004, pp.55-57. ⟨hal-00133883⟩
Thermal de-embedding procedure for cryogenic on-wafer high frequency noise measurement
S. Delcourt, Gilles Dambrine, Nour Eddine Bourzgui, Francois Danneville, C. Laporte, J.P. Fraysse, M. Maignan
2004, pp.414-421. ⟨hal-00133897⟩
Acoustic wave propagation in functionally graded material (FGM) cylinders
L. Elmaimouni, Jean-Etienne Lefebvre, Tadeusz Gryba, V. Zhang
2004, pp.1199-1200. ⟨hal-00142049⟩
Modélisation des pertes de propagation par rayonnement dans un matériau - Application à la caractérisation micro-onde
D. Glay, T. Lasri
2004, pp.Session 9. ⟨hal-00142052⟩
Simulation Monte Carlo de la dynamique électronique dans les dispositifs optoélectroniques à transitions inter-sous-bandes
Jean-Luc Thobel, Olivier Bonno, François Dessenne
9èmes Journées de la Matière Condensée, JMC9, 2004, Nancy, France. ⟨hal-00133959⟩
Strong picosecond ultrasonic responses of semiconductors probed close to interband transitions
R. Cote, Arnaud Devos
2004, pp.2741-2744. ⟨hal-00133845⟩
Multimode underwater transducers
R.E. Newnham, D.C. Markley, R.J. Meyer, W.J. Hughes, Anne-Christine Hladky, J. Cochran
Symposium on Ceramic Materials and Multilayer Electronic Devices, Apr 2003, Nashville, TN, United States. pp.427-443. ⟨hal-00133853⟩