Publications
Affichage de 14101 à 14110 sur 16261
Non-linear modeling of the kink effect in deep sub-micron SOI MOSFET
A. Siligaris, Gilles Dambrine, Francois Danneville
2004, pp.47-50. ⟨hal-00133900⟩
Angle of arrival measurement using ultra fast transient analyzer and music algorithm
A. Benlarbi-Delai, N. Rolland-Haese, A. Ghis, P.A. Rolland
Microwave and Optical Technology Letters, 2004, 41, pp.141-144. ⟨hal-00133924⟩
Novel 2D micronib ionization sources for nano electrospray-mass spectrometry (ESI-MS)
S. Le Gac, C. Rolando, S. Arscott
Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems - EuroSimE 2004, May 2004, Brussels, Belgium. pp.305-309, ⟨10.1109/ESIME.2004.1304055⟩. ⟨hal-02347786⟩
Two Young modulus of Pb(Zr,Ti)03 thin films measured by nanoindentation
Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Eric Cattan, Denis Remiens
Applied Physics Letters, 2004, 85(22), pp. 1-3. ⟨hal-00019767⟩
Sur la signification des valeurs du module d'Young déterminé par nanoindentation dans le cas des matériaux ferroélectriques
Patrick Delobelle, Olivier Guillon, E. Fribourg-Blanc, Caroline Soyer, Denis Remiens
2004. ⟨hal-00020033⟩
Noise in devices and circuits II – Proceedings of SPIE Vol. 5470
Francois Danneville, F. Bonani, J. Deen, M. Levinshtein
SPIE – The International Society for Optical Engineering, Bellingham, WA, USA, 585 p., 2004. ⟨hal-00131720⟩
High indium content pseudomorphic InGaAs layers for high mobility heterostructures on InP(001)
X. Wallart, B. Pinsard, F. Mollot
Proceedings of the 13th International Conference on Molecular Beam Epitaxy, MBE XIII, 2004, Edinburgh, Scotland, United Kingdom. ⟨hal-00142074⟩
The evaluation of surface residual stress in aeronautic bearings using the Barkhausen noise effect
S. Desvaux, Marc Duquennoy, J. Gualandri, Mohamed Ourak
NDT & E International, 2004, 37, pp.9-17. ⟨hal-00142004⟩
Atomic-scale observation of dopant atoms in GaAs
G. Mahieu, D. Deresmes, B. Grandidier, J.P. Nys, D. Stievenard
PICO : The Omicron NanoTechnology Newsletter, 2004, 8, pp.6-7. ⟨hal-00142060⟩