Publications
Affichage de 15391 à 15400 sur 16175
Comparative study of processing methods for analyzing the structure of carbon epoxy composite materials
K. Harrouche, Jean-Michel Rouvaen, Marc Duquennoy, Mohamed Ourak, Mohammadi Ouaftouh
26th Annual Review of Progress in Quantitative Nondestructive Evaluation, 2000, Canada. pp.1191-1198. ⟨hal-00250452⟩
Experimental evaluation of new thermal inversion approach in correlation microwave thermometry
S. Bri, L. Bellarbi, M. Habibi, M. Elkadiri, A. Mamouni
Electronics Letters, 2000, 36, pp.439-440. ⟨hal-00158129⟩
Excitonic and quasiparticle gaps on Si nanocrystals
Christophe Delerue, Michel Lannoo, Guy Allan
Physical Review Letters, 2000, 84, pp.2457-2460. ⟨10.1103/PhysRevLett.84.2457⟩. ⟨hal-00158640⟩
Modeling of the static behavior in two InGaAsP laterally coupled semiconductor diode lasers
M. Leones, H. Lamela, H. Rivera, Jean-Pierre Vilcot, A. Idjeri
2000, pp.319-327. ⟨hal-00158599⟩
Theoretical limits for signal reflections due to inductance for on-chip interconnections
Fabrice Huret, Erick Paleczny, P. Kennis, Denis Deschacht, Gregory Servel
2000, pp.55-60. ⟨hal-00158603⟩
Modeling of Lamb waves generated by integrated transducers in composite plates using a coupled finite element-normal modes expansion method
Emmanuel Moulin, Jamal Assaad, Christophe Delebarre, D. Osmont
Journal of the Acoustical Society of America, 2000, 107, pp.87-94. ⟨hal-00159070⟩
Transmission line analysis via THz photoconductive sampling
Jean-Francois Lampin, F. Mollot
International Terahertz Workshop, 2000, Sandbjerg, Denmark. ⟨hal-00158448⟩
Issues in high frequency noise simulation for deep submicron MOSFET's
J.S. Goo, C.H. Choi, Francois Danneville, Z. Yu, T. Lee, R. Dutton
2000, pp.401-406. ⟨hal-00157897⟩
Stage de sensibilisation des étudiants au travail en salle blanche : réalisation d'éléments actifs et passifs
Virginie Hoel, H. Happy, P. Delemotte, Gilles Dambrine, A. Cappy
VIèmes Journées Pédagogiques du CNFM, 2000, Saint-Malo, France. ⟨hal-00157900⟩
Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFETs
M. Goffioul, Gilles Dambrine, D. Vanhoenacker, J.P. Raskin
Proceedings of the 5th Symposium on Diagnostics and Yield : SOI-Materials, Devices and Characterization, D&Y'2000, 2000, Warsaw, Poland. ⟨hal-00157893⟩