Publications

• Autre publication scientifique

Nouvelles architectures de sources stables programmables en gamme millimétrique et centimétrique

G. Lewandowski

2000. ⟨hal-00158127⟩

• Article dans une revue

A silicon shadow mask for deposition on isolated areas

A. Tixier, Y. Mita, J.P. Gouy, H. Fujita

Journal of Micromechanics and Microengineering, 2000, 10, pp.157-162. ⟨hal-00158497⟩

• Autre publication scientifique

Microélectronique et microtechnologies des composants III-V. Applications aux longueurs d'onde millimétrique et submillimétrique

P. Mounaix

2000. ⟨hal-00158226⟩

• Communication dans un congrès

Visualisation des ondes Ao, So, A1, S1 et A sur une plaque métallique immergée

L. Derbesse, Philippe Pernod, V. Latard, A. Merlen

2000, pp.92-94. ⟨hal-00158457⟩

• Communication dans un congrès

On 2D/3D numerical oxidation modeling : calibration and investigation of silicon crystal orientation effect on stresses in shallow trench isolations

T. Hoffmann, K.F. Dombrowski, V. Senez

2000, pp.59-62. ⟨hal-00158513⟩

• Communication dans un congrès

Optical to millimeter-waves transducers

Jean-Pierre Vilcot

Microwave Photonic Devices and Systems, 2000, Grasmere, France. ⟨hal-00158621⟩

• Autre publication scientifique

Structure électronique et propriétés thermoélectriques des skudttérudites

M. Lassalle

2000. ⟨hal-00158639⟩

• Communication dans un congrès

Signal to noise ratio enhancement using heterojunction bipolar phototransistor by base current compensation

Samuel Dupont, M. Fendler, F. Jorge, Sophie Maricot, Jean-Pierre Vilcot, Didier Decoster

2000, pp.59-61. ⟨hal-00158601⟩

• Communication dans un congrès

Fast photodetection

Jean-Pierre Vilcot, Joseph Harari, M. Fendler, V. Magnin, Samuel Dupont, Didier Decoster

3rd European Microwave Week, Workshop on Microwave Optoelectronics, 2000, Paris, France. ⟨hal-00158617⟩

• Article dans une revue

Measurement of residual phase noise of frequency divider using a single divider technique

V. Brugidou, Paul-Alain Rolland

A new technique for measuring the residual phase noise of a frequency divider is proposed. The new technique enables one divider to be characterised whereas the traditional technique necessitates two dividers. Experimentation demonstrates the validity of the technique, which is quicker and more…

Electronics Letters, 2000, 36 (16), pp.1391-1393. ⟨10.1049/el:20000983⟩. ⟨hal-00158126⟩