Publicaciones

• Article dans une revue

Plasmonic photothermal cancer therapy with gold nanorods/reduced graphene oxide core/shell nanocomposites

Kostiantyn Turcheniuk, Tetiana Dumych, Rostyslav Bilyy, Volodymyr Turcheniuk, Julie Bouckaert, Volodymyr Vovk, Valentyna Chopyak, Vladimir Zaitsev, Pascal Mariot, Natasha Prevarskaya, Rabah Boukherroub, Sabine Szunerits

Gold nanorods (Au NRs) are known for their efficient conversion of photon energy into heat, resulting in hyperthermia and suppression of tumor growth in vitro and in vivo. Au NRs are thus of great promise for photothermal therapy (PTT) of different cancers. From the point of cancer therapy, low...

RSC Advances, 2016, 6 (2), pp.1600-1610. ⟨10.1039/C5RA24662H⟩. ⟨hal-01693288⟩

• Article dans une revue

Piezoelectric MEMS resonators based on ultrathin epitaxial GaN heterostructures on Si

P Leclaire, E Frayssinet, C Morelle, Y Cordier, Didier Theron, Marc Faucher

We present the first results about microelectromechanical (MEMS) resonators fabricated on epitaxial nitride semiconductors with thin buffers engineered for MEMS and NEMS applications. These results assess the use of thin buffers for GaN MEMS fabrication. On a 700 nm thick AlGaN/GaN epilayer, a high...

Journal of Micromechanics and Microengineering, 2016, 26 (10), pp.105015. ⟨10.1088/0960-1317/26/10/105015⟩. ⟨hal-03752321⟩

• Article dans une revue

Enhancing V2X communication based on a new comb-pilot estimation approach

Ahlem Sassi, Yassin El Hillali, Atika Rivenq, F. Charfi, L. Kamoun

International Journal of Vehicular Technology, 2016, 14 p. ⟨hal-03682444⟩

• Communication dans un congrès

Spatial resolution enhancement of near field microwave microscope

S. Gu, Tianjun Lin, T. Lasri

A near-field scanning microwave microscope based on an interferometric technique is proposed in this work. To ensure an optimal spatial resolution, crucial parameters of the evanescent microwave probe are finely studied including the tip apex, the stand-off distance and the scanning step size. ©...

46th European Microwave Conference, EuMC 2016, Oct 2016, London, United Kingdom. pp.544-547, ⟨10.1109/EuMC.2016.7824400⟩. ⟨hal-03538364⟩

• Communication dans un congrès

Contact resistance study of “edge-contacted” metal-graphene interfaces

V. Passi, A. Gahoi, J. Ruhkopf, S. Kataria, Francois Vaurette, E. Pallecchi, H. Happy, M. C. Lemme

The contact resistance RC of "edge-contacted" metal-graphene interfaces is systematically studied. Our experiments demonstrate a reduction of contact resistance by intentional patterning of graphene to create "edge contacts". The parameter space for different hole patterns in...

46th European Solid-State Device Conference, ESSDERC 2016, Sep 2016, Lausanne, Switzerland. pp.236-239, ⟨10.1109/ESSDERC.2016.7599629⟩. ⟨hal-03335829⟩

• Communication dans un congrès

Personal radio-frequency exposimeters in indoor diffuse environments: Measurement and simulation

Reza Aminzadeh, Arno Thielens, Aliou Bamba, Lamine Kone, Davy Gaillot, M. Lienard, Luc Martens, Wout Joseph

The response of personal exposimeters (PEMs) is studied under diffuse field exposure in indoor environments. A numerical model and a setup for on-body calibration measurements in a reverberation chamber (RC) is proposed for 897–5500 MHz. The proposed numerical simulations are in good agreement with...

10th European Conference on Antennas and Propagation, EuCAP 2016, Apr 2016, Davos, Switzerland. Session A23 - Dosimetry, exposure and SAR assessment, 5 p., ⟨10.1109/EuCAP.2016.7481668⟩. ⟨hal-03346232⟩

• Communication dans un congrès

Deep Trench Isolation and Through Silicon Via Wetting Characterization by High-Frequency Acoustic Reflectometry

Christophe Virgilio, Lucile Broussous, Philippe Garnier, Julien Carlier, Pierre Campistron, V. Thomy, Malika Toubal, Pascal Besson, Laurence Gabette, Bertrand Nongaillard

Wetting efficiency of microstructures or nanostructures patterned on Si wafers is a real concern in integrated circuits manufacturing. We present here a high-frequency acoustic method which enables the local determination of the wetting state of a liquid on real DTI and TSV structures. Partial...

13th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), Sep 2016, Knokke, Belgium. ⟨10.4028/www.scientific.net/SSP.255.129⟩. ⟨hal-03280231⟩

• Communication dans un congrès

65 nm SOI CMOS 60 GHz passive mixer for six-port technology

Kamel Haddadi, Christophe Loyez

This work describes the design and measurements of a 60 GHz passive mixer for six-port applications operating and implemented in a 65nm SOI CMOS technology. The mixer topology, consisting only of a n-MOS cold-FET and CPW transmission line matching networks, avoids the use of coupler in front of the...

IEEE Topical Conference on Wireless Sensors and Sensor Networks, WiSNet 2016, Jan 2016, Austin, TX, United States. pp.52-55, ⟨10.1109/WISNET.2016.7444320⟩. ⟨hal-03224660⟩

• Communication dans un congrès

A co-design space exploration tool for avionic high performance heterogeneous embedded architectures

Geoffroy Pertuisot, Nicolas Belanger, Yassin El Hillali, Smail Niar, Atika Rivenq

Avionics in the helicopter manufacturers' landscape faces new challenges. Whereas customers raise continuously their needs in terms of new functions and embedded systems performances, certification authorities maintain complex rules to fulfill for parallel computing. This constraining...

11th International Design and Test Symposium, IDT 2016, Dec 2016, Hammamet, Tunisia. pp.77-82, ⟨10.1109/IDT.2016.7843018⟩. ⟨hal-03528686⟩

• Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate...

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩