Publications
Affichage de 11291 à 11300 sur 16177
Thermoelastic FEM-BEM model for solidly mounted resonator
D. Ekeom, Bertrand Dubus
IEEE International Ultrasonics Symposium, 2008 IEEE IUS, 2008, China. pp.1564-1567, ⟨10.1109/ULTSYM.2008.0381⟩. ⟨hal-00375169⟩
Picosecond ultrasonics : the prefered tool for BAW characterization
P. Emery, Arnaud Devos, P. Ancey
IEEE International Ultrasonics Symposium, 2008 IEEE IUS, 2008, China. pp.2205-2208, ⟨10.1109/ULTSYM.2008.0546⟩. ⟨hal-00375167⟩
Ultrasonic and acoustic method for viscoelastic complex media characterization
Georges Nassar, Fabrice Lefebvre, A. Skaf, Bertrand Nongaillard
Second ASA-EAA Joint Conference, ACOUSTICS'08, 2008, Paris, France. ⟨hal-00362074⟩
The answer to the challenging question : is there any limit size of nanowires ?
D. Hourlier, P. Perrot
Journal of Nano Research, 2008, 4, pp.135-144. ⟨10.4028/www.scientific.net/JNanoR.4.135⟩. ⟨hal-00376227⟩
Photonic-crystal-based cloaking device at optical wavelengths
Olivier Vanbésien, Nathalie Fabre, Xavier Mélique, Didier Lippens
Applied optics, 2008, 47 (10), pp.1358. ⟨10.1364/AO.47.001358⟩. ⟨hal-03748375⟩
Plasma wave detection of sub-terahertz radiation : towards the Dyakonov-Shur instability
S. Boubanga-Tombet, F. Teppe, D. Coquillat, S. Nadar, N. Dyakonova, H. Videlier, W. Knap, D. Seliuta, R. Vadoklis, G. Valusis, A. Shchepetov, Chantal Gardes, Yannick Roelens, S. Bollaert
EOS Annual Meeting, Topical Meeting 2 : Terahertz - Science and Technology, 2008, France. pp.1-2, CDROM. ⟨hal-00360411⟩
Geophysical detection of underground cavities
L. Driad-Lebeau, Bogdan Piwakowski, P. Styles, B. Bourgeois, J.F. Lataste, I. Contrucci
Post-Mining 2008, 2008, France. pp.1-16. ⟨hal-00360392⟩
HEMTs AlSb/InAs pour applications ultra faible consommation
S. Bollaert, A. Olivier, Yannick Roelens, N. Wichmannn, A. Shchepetov, Gilles Dambrine, A. Cappy, L. Desplanques, X. Wallart
12èmes Journées Nano, Micro et Optoélectronique, JNMO'08, 2008, St Pierre d'Oléron, France. ⟨hal-00361523⟩
Characterization of silicon nitride thin films used as stressor liners on CMOS FETs
G. Raymond, Pascal Morin, Arnaud Devos, D.A. Hess, M. Braccini, F. Volpi
9th International Conference on Ultimate Integration of Silicon, ULIS 2008, 2008, Italy. pp.199-202, ⟨10.1109/ULIS.2008.4527173⟩. ⟨hal-00360388⟩