Publications

Affichage de 11351 à 11360 sur 16094


  • Article dans une revue

Growth and structural characterization of cerium oxide thin films realized on Si(111) substrates by on-axis r.f. magnetron sputtering

M.T. Ta, D. Briand, Y. Guhel, J. Bernard, J.C. Pesant, B. Boudart

Thin Solid Films, 2008, 517, pp.450-452. ⟨10.1016/j.tsf.2008.08.059⟩. ⟨hal-00360032⟩

  • Article dans une revue

Particle cross transfer

L. Dobrzynski, Abdellatif Akjouj

Surface Science Reports, 2008, 63, pp.391-399. ⟨10.1016/j.surfrep.2008.04.001⟩. ⟨hal-00357384⟩

  • Article dans une revue

Effect of gate length in InAs/AlSb HEMTs biased for low power or high gain

M. Borg, E. Lefebvre, M. Malmkvist, L. Desplanque, X. Wallart, Yannick Roelens, Gilles Dambrine, A. Cappy, S. Bollaert, J. Grahn

Solid-State Electronics, 2008, 52, pp.775-781. ⟨10.1016/j.sse.2007.12.002⟩. ⟨hal-00356942⟩

  • Article dans une revue

Magnesium diffusion profile in GaN grown by MOVPE

Z. Benzarti, I. Halidou, Z. Bougrioua, T. Boufaden, B. El Jani

Journal of Crystal Growth, 2008, 310, pp.3274-3277. ⟨10.1016/j.jcrysgro.2008.04.008⟩. ⟨hal-00356993⟩

  • Communication dans un congrès

Imaging the electron local density of states inside buried semiconductor quantum rings

B. Hackens, F. Martins, M.G. Pala, H. Sellier, T. Ouisse, X. Wallart, S. Bollaert, A. Cappy, V. Bayot, S. Huant

29th Conference on the Physics of Semiconductors, Rio de Janeiro, July 27- August 1, 2008, Jul 2008, Rio de Janeiro, Brazil. ⟨hal-00392551⟩

  • Communication dans un congrès

Superfocusing with THz strip plasmonics and Si-nanowires for near-field microscopy

Tahsin Akalin, Emilien Peytavit, D. Hourlier-Bahloul, Jean-Francois Lampin

Gordon Research Conference : PLASMONICS, Optics at the Nanoscale, 2008, Tilton, NH, United States. ⟨hal-00361533⟩

  • Communication dans un congrès

Electron microscopy of silicides formation in Schottky barrier contacts to electronic devices

J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, N. Reckinger, Xing Tang, G. Larrieu, Emmanuel Dubois

XIII International Conference on Electron Microscopy, EM'2008, 2008, Cracow-Zakopane, Poland. ⟨hal-00361545⟩