Publications
Affichage de 11351 à 11360 sur 16094
Growth and structural characterization of cerium oxide thin films realized on Si(111) substrates by on-axis r.f. magnetron sputtering
M.T. Ta, D. Briand, Y. Guhel, J. Bernard, J.C. Pesant, B. Boudart
Thin Solid Films, 2008, 517, pp.450-452. ⟨10.1016/j.tsf.2008.08.059⟩. ⟨hal-00360032⟩
Particle cross transfer
L. Dobrzynski, Abdellatif Akjouj
Surface Science Reports, 2008, 63, pp.391-399. ⟨10.1016/j.surfrep.2008.04.001⟩. ⟨hal-00357384⟩
Electrochemical impedance spectroscopy and surface plasmon resonance studies of DNA hybridization on gold/SiO<sub><i>x</i></sub> interfaces
Maël Manesse, Valérie Stambouli, Rabah Boukherroub, Sabine Szunerits
Effect of gate length in InAs/AlSb HEMTs biased for low power or high gain
M. Borg, E. Lefebvre, M. Malmkvist, L. Desplanque, X. Wallart, Yannick Roelens, Gilles Dambrine, A. Cappy, S. Bollaert, J. Grahn
Solid-State Electronics, 2008, 52, pp.775-781. ⟨10.1016/j.sse.2007.12.002⟩. ⟨hal-00356942⟩
Magnesium diffusion profile in GaN grown by MOVPE
Z. Benzarti, I. Halidou, Z. Bougrioua, T. Boufaden, B. El Jani
Journal of Crystal Growth, 2008, 310, pp.3274-3277. ⟨10.1016/j.jcrysgro.2008.04.008⟩. ⟨hal-00356993⟩
Time-resolved detection of single-electron interference
S. Gustavsson, R. Leturcq, M. Studer, T. Ihn, K. Ensslin, D.C. Driscoll, A.C. Gossard
Nano Letters, 2008, 8, pp.2547-2550. ⟨10.1021/nl801689t⟩. ⟨hal-00357780⟩
Imaging the electron local density of states inside buried semiconductor quantum rings
B. Hackens, F. Martins, M.G. Pala, H. Sellier, T. Ouisse, X. Wallart, S. Bollaert, A. Cappy, V. Bayot, S. Huant
29th Conference on the Physics of Semiconductors, Rio de Janeiro, July 27- August 1, 2008, Jul 2008, Rio de Janeiro, Brazil. ⟨hal-00392551⟩
Superfocusing with THz strip plasmonics and Si-nanowires for near-field microscopy
Tahsin Akalin, Emilien Peytavit, D. Hourlier-Bahloul, Jean-Francois Lampin
Gordon Research Conference : PLASMONICS, Optics at the Nanoscale, 2008, Tilton, NH, United States. ⟨hal-00361533⟩
Electron microscopy of silicides formation in Schottky barrier contacts to electronic devices
J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, N. Reckinger, Xing Tang, G. Larrieu, Emmanuel Dubois
XIII International Conference on Electron Microscopy, EM'2008, 2008, Cracow-Zakopane, Poland. ⟨hal-00361545⟩
Composants nanométriques balistiques de la filière InGaAs/InAlAs/InP pour applications hautes fréquences
C. Gardes
2008. ⟨hal-00362086⟩