Publications
Affichage de 12521 à 12530 sur 16175
Ultrasonic evaluation of residual stresses in flat glass tempering by an original double interferometric detection
D. Devos, Marc Duquennoy, E. Romero, Frédéric Jenot, Dominique Lochegnies, Mohammadi Ouaftouh, Mohamed Ourak
Ultrasonics, 2006, 44, pp.923-927. ⟨hal-00138722⟩
Détection des marnières de Haute Normandie par sismique haute résolution
Bogdan Piwakowski, Lynda Driad-Lebeau, Arkadiusz Kosecki, Pawel Safinowski
Journées AGAP Qualité - GEOFCAN "Géophysique appliquée à la reconnaissance des cavités et des structures anthropiques", Nov 2006, Besançon, France. pp.28-31. ⟨ineris-00973240⟩
Apodized Bragg filters on InP materials ridge waveguides using sampled gratings
S. Garidel, D. Lauvernier, Jean-Pierre Vilcot, M. Francois, Didier Decoster
Microwave and Optical Technology Letters, 2006, 48 (8), pp.1627-1630. ⟨10.1002/mop.21682⟩. ⟨hal-00130862⟩
Surface Science Reports
W.H. Weinberg, V. Bortolani, J.G. Chen, U. Diebold, L. Dobrzynski, H. Freund, M. Grunze, M. Kawai, T.E. Madey, M. Scheffler, G. Thornton, M. Tirrell
Elsevier, pp.Review Journal, 2006. ⟨hal-00577041⟩
Systematic lossy error protection of video based on reduced spatial resolution
M. Ramon, François-Xavier Coudoux, Marc G. Gazalet, M Gharbi, Patrick Corlay
13th International Conference on Electronics, Circuits and Systems, ICECS 2006, 2006, France. pp.850-853, ⟨10.1109/ICECS.2006.379922⟩. ⟨hal-00247416⟩
Noise and dynamic cryogenic performance of metamorphic transistors from 20 to 42 GHz
S. Delcourt, Gilles Dambrine, Nour Eddine Bourzgui, Sylvie Lepilliet, C. Laporte, D. Smith, J.P. Fraysse
1st European Microwave Integrated Circuits Conference, EuMIC 2006, 2006, United Kingdom. pp.9-12, ⟨10.1109/EMICC.2006.282736⟩. ⟨hal-00241318⟩
New technology for high throughput BioMEMS
Vianney Mille, Nour Eddine Bourzgui, Bertrand Bocquet
Actes du Congrès Français de Microfluidique, 2006, Toulouse, France. ⟨hal-00244019⟩
40 nm PtSi-based Schottky-barrier p-MOSFETs with a midgap tungsten gate
Emmanuel Dubois, G. Larrieu
7th Symposium Diagnostics & Yield Advanced Silicon Devices and Technologies for ULSI Era, 2006, Warsaw, Poland. ⟨hal-00138697⟩
Power measurement setup for large signal microwave characterization at 94 GHz
F Medjdoub, S. Vandenbrouck, Christophe Gaquière, E. Delos, M. Zaknoune, D. Theron
IEEE Electron Device Letters, 2006, 16, pp.218-220. ⟨hal-00127945⟩
Triple issues for triple junctions
F. Cleri
Metallphysikalisches Kolloquium am IMM (Institute of Physical Metallurgy and Metal Physics), 2006, Aachen, Germany. ⟨hal-00127949⟩