Publications

Affichage de 12731 à 12740 sur 16104


  • Article dans une revue

TEM study of PtSi contacts layers for low Schottky barrier MOSFETs

A. Laszcz, J. Katcki, J. Ratajczak, A. Czerwinski, N. Breil, G. Larrieu, Emmanuel Dubois

We report investigations of the silicide formation process in the Pt/Si structure of low Schottky barrier MOSFETs on SOI. The silicide layers are used there as source and drain contacts and the high quality of the silicide/Si interface and the silicide structure are essential for the electrical…

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2006, 253 (1-2), pp.274-277. ⟨10.1016/j.nimb.2006.10.033⟩. ⟨hal-00138656⟩

  • Communication dans un congrès

Design of distributed amplifiers and oscillators in 130 nm SOI MOS technology

M. Si Moussa, C. Pavageau, L. Picheta, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanhoenacker-Janvier

2006, 4 pp. ⟨hal-00128229⟩

  • Communication dans un congrès

Finite size effects and dynamical properties of mesoscopic ferroelectrics

Laurent Baudry

8th European Conference on Applications of Polar Dielectrics, 2006, Metz, France. ⟨hal-00128181⟩

  • Communication dans un congrès

Ultra-low voltage MEMS resonator based on RSG-MOSFET

N. Abele, K. Segueni, K. Boucart, F. Casset, Bernard Legrand, L. Buchaillot, P. Ancey, A.M. Ionescu

2006, pp.882-885. ⟨hal-00128669⟩

  • Communication dans un congrès

Parallel-plate electrostatic actuators in liquids : displacement-voltage optimisation for microfluidic applications

Bernard Legrand, A.S. Rollier, L. Buchaillot, D. Collard

2006, pp.718-721. ⟨hal-00128668⟩

  • Communication dans un congrès

Self-assembling carbon nanotubes for electronics

J.P. Bourgoin, S. Auvray, J. Borghetti, Vincent Derycke, M.F. Goffman, P. Chenevier, L. Goux-Capes, A. Filoramo, R. Lefevre, S. Straif, K. Nguyen, S. Lyonnais, Et Al., D. Vuillaume

Trends in Nanotechnology Conference, TNT2006, 2006, Grenoble, France. ⟨hal-00138912⟩

  • Communication dans un congrès

Damaging process determination

L. Buchaillot, O. Millet

Symposium on Mechanical Reliability of Silicon MEMS – Recent progress and further requirements, 2006, Halle Saale, Germany. ⟨hal-00128690⟩