Publications
Affichage de 13161 à 13170 sur 16055
Apodized filters on InP-material ridge waveguides using sampled Bragg gratings
S. Garidel, Jean-Pierre Vilcot, Didier Decoster
2005, pp.121. ⟨hal-00130829⟩
Optical summation of microwave signals
G. Ulliac, N. Breuil, C. Fourdin, P. Nicole, Jean-Pierre Vilcot, Didier Decoster, J. Chazelas
NEFERTITI Workshop on Millimetre Wave Photonic Devices and Technologies for Wireless and Imaging Applications, 2005, Bruxelles, Belgium. ⟨hal-00130838⟩
Effet du désordre dans un démultiplexeur nanométrique plasmonique
Maxime Beaugeois, Abdellatif Akjouj, Bahram Djafari-Rouhani, Jerome O. Vasseur, Yan Pennec, Mohamed Bouazaoui, Jean-Pierre Vilcot, Sophie Maricot, J.P. Vigneron, L. Dobrzynski
Congrès Général de la Société Française de Physique et de la Belgian Physical Society, Aug 2005, Lille, France. ⟨hal-00130845⟩
HEMTs with InP and InAsP channel for 94 GHz applications
D. Theron, F Medjdoub, M. Zaknoune, Christophe Gaquière, X. Wallart
14th European Workshop on Heterostructure Technology, HeTech'05, 2005, Smolenice, Slovakia. ⟨hal-00126469⟩
Empirical MOSFET modelling for RF circuit design
A. Siligaris, Gilles Dambrine, F. Sischka, Francois Danneville
2005, 4 pp. ⟨hal-00147493⟩
Determination by nanoindentation method of sputtered PZT films mechanical parameters for Si-MEMS applications
Patrick Delobelle, E. Fribourg-Blanc, Olivier Guillon, S. Soyer, Eric Cattan, Denis Remiens
Integr. Ferroelectrics, 2005, 69, pp. 213-221. ⟨hal-00019721⟩
Exons, introns and DNA thermodynamics
Enrico Carlon, Mehdi Lejard Malki, Ralf Blossey
Physical Review Letters, 2005, 94, pp.178101. ⟨10.1103/PhysRevLett.94.178101⟩. ⟨hal-00128506⟩
2D axisymmetric numerical simulation of supercritical phase conjugation of ultrasound in active solid media
Olivier Bou Matar, Vladimir Preobrazhensky, Philippe Pernod
Journal of the Acoustical Society of America, 2005, 118, pp.2880-2890. ⟨hal-00137664⟩
SU-8 based arch-like microfluidic microchannels using single mask/single step photolithography
M. Gaudet, S. Arscott, J.C. Camart, L. Buchaillot
2005, pp.1189-1192. ⟨hal-00130826⟩
MEMS reliability : metrology set-up for investigation of fatigue causes
O. Millet, O. Blanrue, Bernard Legrand, D. Collard, L. Buchaillot
2005, pp.483-486. ⟨hal-00125627⟩