Publications

Affichage de 13161 à 13170 sur 16055


  • COMM

Apodized filters on InP-material ridge waveguides using sampled Bragg gratings

S. Garidel, Jean-Pierre Vilcot, Didier Decoster

2005, pp.121. ⟨hal-00130829⟩

  • COMM

Optical summation of microwave signals

G. Ulliac, N. Breuil, C. Fourdin, P. Nicole, Jean-Pierre Vilcot, Didier Decoster, J. Chazelas

NEFERTITI Workshop on Millimetre Wave Photonic Devices and Technologies for Wireless and Imaging Applications, 2005, Bruxelles, Belgium. ⟨hal-00130838⟩

  • COMM

Effet du désordre dans un démultiplexeur nanométrique plasmonique

Maxime Beaugeois, Abdellatif Akjouj, Bahram Djafari-Rouhani, Jerome O. Vasseur, Yan Pennec, Mohamed Bouazaoui, Jean-Pierre Vilcot, Sophie Maricot, J.P. Vigneron, L. Dobrzynski

Congrès Général de la Société Française de Physique et de la Belgian Physical Society, Aug 2005, Lille, France. ⟨hal-00130845⟩

  • COMM

HEMTs with InP and InAsP channel for 94 GHz applications

D. Theron, F Medjdoub, M. Zaknoune, Christophe Gaquière, X. Wallart

14th European Workshop on Heterostructure Technology, HeTech'05, 2005, Smolenice, Slovakia. ⟨hal-00126469⟩

  • COMM

Empirical MOSFET modelling for RF circuit design

A. Siligaris, Gilles Dambrine, F. Sischka, Francois Danneville

2005, 4 pp. ⟨hal-00147493⟩

  • ART

Determination by nanoindentation method of sputtered PZT films mechanical parameters for Si-MEMS applications

Patrick Delobelle, E. Fribourg-Blanc, Olivier Guillon, S. Soyer, Eric Cattan, Denis Remiens

Integr. Ferroelectrics, 2005, 69, pp. 213-221. ⟨hal-00019721⟩

  • ART

2D axisymmetric numerical simulation of supercritical phase conjugation of ultrasound in active solid media

Olivier Bou Matar, Vladimir Preobrazhensky, Philippe Pernod

Journal of the Acoustical Society of America, 2005, 118, pp.2880-2890. ⟨hal-00137664⟩

  • COMM

SU-8 based arch-like microfluidic microchannels using single mask/single step photolithography

M. Gaudet, S. Arscott, J.C. Camart, L. Buchaillot

2005, pp.1189-1192. ⟨hal-00130826⟩

  • COMM

MEMS reliability : metrology set-up for investigation of fatigue causes

O. Millet, O. Blanrue, Bernard Legrand, D. Collard, L. Buchaillot

2005, pp.483-486. ⟨hal-00125627⟩