Publications
Affichage de 13381 à 13390 sur 16256
TEM characterisation of accumulation low Schottky barrier MOSFET with PtSi contacts
A. Laszcz, J. Katcki, J. Ratajczak, A. Czerwinski, Emmanuel Dubois, G. Larrieu, X. Wallart
School on Materials Science and Electron Microscopy, Microscopy of Tomorrow's Industrial Materials, 2005, Berlin, Germany. ⟨hal-00138408⟩
Schottky-barrier source-drain architecture for ultimate CMOS
Emmanuel Dubois, G. Larrieu, N. Breil, Xing Tang, N. Recklinger, V. Bayot, J. Knoch
SINANO Workshop, 2005, Grenoble, France. ⟨hal-00138409⟩
Resonant transmission in stop bands of acoustic waves in periodic structures
Victor Y. Zhang, Jean-Etienne Lefebvre, Tadeusz Gryba
Proceedings of the 2005 Joint World Congress on Ultrasonics/Ultrasonics International, WCU/UI'05, Aug 2005, Beijing, China. ⟨hal-00140785⟩
Simple plasmon multiplexer
L. Dobrzynski, Maxime Beaugeois, Abdellatif Akjouj, Bahram Djafari-Rouhani, Jerome O. Vasseur, Yan Pennec, Mohamed Bouazaoui, Jean-Pierre Vilcot, Sophie Maricot, J.P. Vigneron
International Symposium on Photons and Phonons in Solids, 2005, Puebla, Mexico. ⟨hal-00130839⟩
Sommation optique de signaux hyperfréquences
G. Ulliac, Jean-Pierre Vilcot, Didier Decoster, J. Chazelas
TELECOM'2005 & 4èmes Journées Franco-Maghrébines des Microondes et leurs Applications, 2005, Rabat, Maroc. ⟨hal-00130840⟩
On the analysis of four symmetrical interconnects for signal integrity evaluation
Freddy Ponchel, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht
2005, pp.145-147. ⟨hal-00162804⟩
Simulation de formes d'ondes ULB dans un modèle de canal en tunnel
H. Saghir, M. Heddebaut, Fouzia Boukour
Actes du GDR Ondes, groupe ULB, 2005, Grenoble, France. ⟨hal-00126754⟩
Trichlorosilane isocyanate as coupling agent for mild conditions functionalization of silica-coated surfaces
N. Ardes-Guisot, J.O. Durand, M. Granier, A. Perzyna, Yannick Coffinier, B. Grandidier, X. Wallart, D. Stievenard
Langmuir, 2005, 21, pp.9406-9408. ⟨10.1021/la051256r⟩. ⟨hal-00126430⟩
Electric force microscopy of individually charged semiconductor nanoparticles
Heinrich Diesinger, Thierry Melin, Sophie Barbet, D. Deresmes, Didier Stiévenard
Trends in Nanotechnology, TNT 2005, Aug 2005, Oviedo, Spain. ⟨hal-00126431⟩
Semiconductor surface reconstructions of the Si(100) surface at 5K
A. Urbieta, B. Grandidier, J.P. Nys, D. Deresmes, D. Stiévenard
52nd International Symposium and Exhibition of the American Vacuum Society, AVS-52, 2005, Boston, MA, United States. ⟨hal-00126447⟩