Publications

• COMM

Data transmission and distance measurement between two trains in tunnels

M. Lienard, Pierre Laly, Pierre Degauque

2004, pp.CD session B2. ⟨hal-00142001⟩

• COMM

A computational model for the Si/C/N nanopowder

Mohamed Amara, M. El Ganaoui, D. Hourlier

21st International Congress of Theoretical and Applied Mechanics, ICTAM04, 2004, Warsaw, Poland. ⟨hal-00248023⟩

• COUV

Application of PZT-film-Si-substrate structures for various types of position sensitive pyroelectric detectors of radiation

S. Bravina, Eric Cattan, N. Morozovsky, Denis Remiens

Pandalai S.G. Recent Research Developments in Applied Physics, Vol. 7, Part I, Research Signpost, Kerala, India, pp.177-196, 2004. ⟨hal-00139043⟩

• COMM

Two-photon absorption in InP substrates in the 1.55 µm range

D. Vignaud, Jean-Francois Lampin, F. Mollot

2004, pp.134-137. ⟨hal-00140715⟩

• COMM

THz study of liquids using an integrated bragg filter

Jean-Francois Lampin, L. Desplanque, M. Ternisien, T. Crepin, C. Walloth, D. Lippens, F. Mollot

2004, pp.469-470. ⟨hal-00140721⟩

• COMM

Caractérisation de films d'alcènes greffés sur des surfaces Si(111) par analyse XPS résolue angulairement

X. Wallart, C. Henry de Villeneuve, P. Allongue

2004, pp.152-157. ⟨hal-00140723⟩

• ART

Visualization of phase conjugate ultrasound waves passed through inhomogeneous layer

K. Yamamoto, Philippe Pernod, Vladimir Preobrazhensky

Ultrasonics, 2004, 42, pp.1049-1052. ⟨hal-00140728⟩

• ART

Effects of grain boundaries, field dependent mobility and interface state traps on the characteristics of pentacene thin film transistor

A. Bolognesi, M. Berliocchi, M. Manenti, Aldo Di Carlo, Paolo Lugli, Kamal Lmimouni, Claude Dufour

We have fabricated pentacene-based thin film transistors and analyzed their electrical properties with the help of two-dimensional drift-diffusion simulations which favorably compare with the experimental results. We have set up a model considering the polycrystalline nature of pentacene and the…

IEEE Transactions on Electron Devices, 2004, 51 (12), pp.1997-2003. ⟨10.1109/TED.2004.838333⟩. ⟨hal-00140735⟩

• ART

Depth dependence of defect evolution and TED during annealing

B. Colombeau, N.E.B. Cowern, Fuccio Cristiano, P. Calvo, Y. Lamrani, Nikolay Cherkashin, E. Lampin, Alain Claverie

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2004, 216, pp.90-94. ⟨hal-00140976⟩

• COMM

Modelisation et simulation de la technlogie MOS ultimes

E. Lampin, Christophe Krzeminski, T. Alkalin, V. Cuny

GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00140992⟩