Publications
Affichage de 14161 à 14170 sur 16263
Bruit dans les nouveaux composants et matériaux ou bruit fiabilité
Jean-Guy Tartarin, Geoffroy Soubercaze-Pun, Abdelali Rennane, Laurent Bary, Robert Plana, Jean-Claude de Jaeger, S. Delage, Jacques Graffeuil
Workshop Action Spécifique Bruit : Bruit en régime linéaire et non-linéaire dans les composants et circuits de télécommunications, 2004, La Grande Motte, France. ⟨hal-00141964⟩
A multi-mode continuously-tunable lowpass filter for zero-IF mobile applications
D. Chamla, A. Kaiser, A. Cathelin, D. Belot
2004, pp.95-98. ⟨hal-00140982⟩
Optimisation and simulation of an alternative nano-flash memory : the SASEM device
Christophe Krzeminski, Emmanuel Dubois, Xing Tang, N. Reckinger, A. Crahay, V. Bayot
2004, pp.45-50. ⟨hal-00140991⟩
Microactuators and microstrip antenna for polarization diversity
L. Le Garec, I. Roch, Mohamed Himdi, R. Sauleau, O. Millet, L. Buchaillot
2004, pp.D16-D19. ⟨hal-00141027⟩
Predictive modelling of the fatigue phenomenon for polycristalline structural layers
O. Millet, Pierre Bertrand, Bernard Legrand, D. Collard, L. Buchaillot
2004, pp.145-148. ⟨hal-00141028⟩
Analysis of right- and left-handed dispersive transmission lines at terahertz frequencies
Jean-Francois Lampin, T. Crepin, M. Perrin, M. Ternisien, L. Desplanque, F. Mollot, D. Lippens
2004, pp.101-102. ⟨hal-00140722⟩
Modélisation et simulation de la technologie des MOS ultimes
Evelyne Lampin, Christophe Krzeminski, Tahsin Akalin, V. Cuny
Journées Nationales Nanoélectronique, 2004, Aussois, France. ⟨hal-00141007⟩
EXAFS characterization of the gel leading to a hydrothermal deposition of PZT films
S. Euphrasie, S. Daviero-Minaud, Philippe Pernod
Integrated Ferroelectrics, 2004, 60, pp.117-130. ⟨hal-00140718⟩
RF and noise properties of SOI MOSFETs, including the influence of a direct tunneling gate current
Francois Danneville, G. Pailloncy, Gilles Dambrine, B. Iniguez
2004, pp.103-110. ⟨hal-00154886⟩
Hot carrier aging degradation phenomena in GaN based MESFETs
F. Rampazzo, G. Pierobon, D. Pacetta, Christophe Gaquière, D. Theron, B. Boudart, G. Meneghesso, E. Zanoni
Microelectronics Reliability, 2004, 44, pp.1375-1380. ⟨hal-00154890⟩