Publications
Affichage de 14291 à 14300 sur 16098
Grazing incidence diffraction anomalous fine structure : a tool for investigating strain distribution and interdiffusion in InAs/InP quantum wires
A. Letoublon, Hubert Renevier, M.G. Proietti, C. Priester, M.L. Gonzalez, J.M. Garcia
2003, pp.541-542. ⟨hal-00149938⟩
Strong effect of interband transitions in the picosecond ultrasonics response of metallic thin films
Arnaud Devos, A. Le Louarn
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.045405/1-6. ⟨10.1103/PhysRevB.68.045405⟩. ⟨hal-00144884⟩
Contribution à la caractérisation diélectrique microonde de cristaux liquides. Applications aux circuits agiles en fréquence
N. Tentillier
2003. ⟨hal-00162747⟩
Electro-optical probe dedicated to the on-line testing of electronic systems
B. Pannetier, P. Lemaitre-Auger, S. Tedjini, El Hadj Dogheche, Denis Remiens
2003, pp.275. ⟨hal-00162741⟩
Crystallographic and optical properties of epitaxial Pb(Zr-0.6,Ti-0.4)O-3 thin films grown on LaAlO3 substrates
B. Vilquin, R. Bouregba, G. Poullain, H. Murray, El Hadj Dogheche, Denis Remiens
Journal of Applied Physics, 2003, 94 (8), pp.5167-5171. ⟨10.1063/1.1610776⟩. ⟨hal-00162729⟩
High frequency noise sources extraction in nanometrique MOSFETs
Francois Danneville, G. Pailloncy, Gilles Dambrine
NATO Advanced Research Workshop, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, 2003, Brno, Czech Republic. ⟨hal-00146038⟩
Nondestructive defects detection inside dielectric materials by microwave techniques
M. Maazi, D. Glay, T. Lasri
2003, pp.Session 3A. ⟨hal-00146044⟩
Inelastic electron tunneling spectroscopy in n-MOS junctions with ultra-thin oxides
C. Petit, G. Salace, D. Vuillaume
Solid-State Electronics, 2003, 47, pp.1663-1668. ⟨hal-00146155⟩
Self-assembled materials
D. Vuillaume
International Summer School on Advanced Microelectronics, MIGAS 2003, 2003, Autrans, France. ⟨hal-00146172⟩
Relation between thermal evolution of interstitial defects and transient enhanced diffusion in silicon
Alain Claverie, Fuccio Cristiano, B. Colombeau, Xavier Hebras, P. Calvo, Nikolay Cherkashin, Y. Lamrani, E. Scheid, B. de Mauduit
2003, pp.73. ⟨hal-00146421⟩