Publications

Affichage de 14291 à 14300 sur 16098


  • Communication dans un congrès

Grazing incidence diffraction anomalous fine structure : a tool for investigating strain distribution and interdiffusion in InAs/InP quantum wires

A. Letoublon, Hubert Renevier, M.G. Proietti, C. Priester, M.L. Gonzalez, J.M. Garcia

2003, pp.541-542. ⟨hal-00149938⟩

  • Communication dans un congrès

Electro-optical probe dedicated to the on-line testing of electronic systems

B. Pannetier, P. Lemaitre-Auger, S. Tedjini, El Hadj Dogheche, Denis Remiens

2003, pp.275. ⟨hal-00162741⟩

  • Communication dans un congrès

High frequency noise sources extraction in nanometrique MOSFETs

Francois Danneville, G. Pailloncy, Gilles Dambrine

NATO Advanced Research Workshop, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, 2003, Brno, Czech Republic. ⟨hal-00146038⟩

  • Communication dans un congrès

Nondestructive defects detection inside dielectric materials by microwave techniques

M. Maazi, D. Glay, T. Lasri

2003, pp.Session 3A. ⟨hal-00146044⟩

  • Article dans une revue

Inelastic electron tunneling spectroscopy in n-MOS junctions with ultra-thin oxides

C. Petit, G. Salace, D. Vuillaume

Solid-State Electronics, 2003, 47, pp.1663-1668. ⟨hal-00146155⟩

  • Communication dans un congrès

Self-assembled materials

D. Vuillaume

International Summer School on Advanced Microelectronics, MIGAS 2003, 2003, Autrans, France. ⟨hal-00146172⟩

  • Communication dans un congrès

Relation between thermal evolution of interstitial defects and transient enhanced diffusion in silicon

Alain Claverie, Fuccio Cristiano, B. Colombeau, Xavier Hebras, P. Calvo, Nikolay Cherkashin, Y. Lamrani, E. Scheid, B. de Mauduit

2003, pp.73. ⟨hal-00146421⟩