Publications

Affichage de 5591 à 5600 sur 15761


  • Article dans une revue

A Configurable Transmitter Architecture for IEEE 802.11ac and 802.11ad Standards

Fikre Tsigabu Gebreyohannes, Antoine Frappé, Andreas Kaiser

IEEE Transactions on Circuits and Systems II: Express Briefs, 2016, 63 (1), pp.9-13. ⟨10.1109/TCSII.2015.2468920⟩. ⟨hal-03377045⟩

  • Article dans une revue

Transport properties of multigrained nanocomposites with imperfect interfaces

Pier Luca Palla, Stefano Giordano

Journal of Applied Physics, 2016, 120 (18), 184301, 9 p. ⟨10.1063/1.4967316⟩. ⟨hal-03407507⟩

  • Communication dans un congrès

Characterization and modeling of traps and RF frequency dispersion in AlGaN/AlN/GaN HEMTs

Hector Sanchez-Martin, Oscar Garcia-Perez, Ignacio Íñiguez-De-La-Torre, Susana Perez, Tomás González, Javier Mateos, Philippe Altuntas, N. Defrance, Marie Lesecq, Virginie Hoel, Yvon Cordier, Stephanie Rennesson

The performance of GaN transistors is still limited by physical and fabrication problems, mainly related to different kinds of traps. In this work, virgin transistors reveals strong low frequency dispersion both in the transconductance and output conductance, that we attribute to the presence of…

11th European Microwave Integrated Circuits Conference (EuMIC), Oct 2016, London, United Kingdom. paper EuMIC10-03, 153-156, ⟨10.1109/EuMIC.2016.7777513⟩. ⟨hal-03270103⟩

  • Communication dans un congrès

Deep Trench Isolation and Through Silicon Via Wetting Characterization by High-Frequency Acoustic Reflectometry

Christophe Virgilio, Lucile Broussous, Philippe Garnier, Julien Carlier, Pierre Campistron, V. Thomy, Malika Toubal, Pascal Besson, Laurence Gabette, Bertrand Nongaillard

Wetting efficiency of microstructures or nanostructures patterned on Si wafers is a real concern in integrated circuits manufacturing. We present here a high-frequency acoustic method which enables the local determination of the wetting state of a liquid on real DTI and TSV structures. Partial…

13th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), Sep 2016, Knokke, Belgium. ⟨10.4028/www.scientific.net/SSP.255.129⟩. ⟨hal-03280231⟩

  • Article dans une revue

Growth of c -Axis-Oriented BiCuSeO Thin Films Directly on Si Wafers

Xiaolin Wu, Linjie Gao, Pascal Roussel, El Hadj Dogheche, Jianglong Wang, Guangsheng Fu, Shufang Wang

Single-phase, c-axis-oriented BiCuSeO thin films have been directly grown on the commercial silicon (001) wafers without any surface pretreatment by using pulsed laser deposition. X-ray diffraction pole figure confirms that the film does not have any ab-plane texture, whereas cross-sectional…

Journal of the American Ceramic Society, 2016, 99 (10), pp.3367-3370. ⟨10.1111/jace.14359⟩. ⟨hal-02263699⟩

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