Publications

Affichage de 5891 à 5900 sur 16064


  • Communication dans un congrès

Estimation of an approximated likelihood ratio for iterative decoding in impulsive environment

Vincent Dimanche, Alban Goupil, Laurent Clavier, Guillaume Gelle

IEEE Wireless Communications and Networking Conference (WCNC), 2016, Doha, Qatar. pp.1-6, ⟨10.1109/WCNC.2016.7565031⟩. ⟨hal-02088568⟩

  • Article dans une revue

A Configurable Transmitter Architecture for IEEE 802.11ac and 802.11ad Standards

Fikre Tsigabu Gebreyohannes, Antoine Frappé, Andreas Kaiser

IEEE Transactions on Circuits and Systems II: Express Briefs, 2016, 63 (1), pp.9-13. ⟨10.1109/TCSII.2015.2468920⟩. ⟨hal-03377045⟩

  • Communication dans un congrès

Contact resistance study of “edge-contacted” metal-graphene interfaces

V. Passi, A. Gahoi, J. Ruhkopf, S. Kataria, Francois Vaurette, E. Pallecchi, H. Happy, M. C. Lemme

The contact resistance RC of "edge-contacted" metal-graphene interfaces is systematically studied. Our experiments demonstrate a reduction of contact resistance by intentional patterning of graphene to create "edge contacts". The parameter space for different hole patterns in…

46th European Solid-State Device Conference, ESSDERC 2016, Sep 2016, Lausanne, Switzerland. pp.236-239, ⟨10.1109/ESSDERC.2016.7599629⟩. ⟨hal-03335829⟩

  • Communication dans un congrès

A co-design space exploration tool for avionic high performance heterogeneous embedded architectures

Geoffroy Pertuisot, Nicolas Belanger, Yassin El Hillali, Smail Niar, Atika Rivenq

Avionics in the helicopter manufacturers' landscape faces new challenges. Whereas customers raise continuously their needs in terms of new functions and embedded systems performances, certification authorities maintain complex rules to fulfill for parallel computing. This constraining…

11th International Design and Test Symposium, IDT 2016, Dec 2016, Hammamet, Tunisia. pp.77-82, ⟨10.1109/IDT.2016.7843018⟩. ⟨hal-03528686⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate…

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩

  • Article dans une revue

Growth of c -Axis-Oriented BiCuSeO Thin Films Directly on Si Wafers

Xiaolin Wu, Linjie Gao, Pascal Roussel, El Hadj Dogheche, Jianglong Wang, Guangsheng Fu, Shufang Wang

Single-phase, c-axis-oriented BiCuSeO thin films have been directly grown on the commercial silicon (001) wafers without any surface pretreatment by using pulsed laser deposition. X-ray diffraction pole figure confirms that the film does not have any ab-plane texture, whereas cross-sectional…

Journal of the American Ceramic Society, 2016, 99 (10), pp.3367-3370. ⟨10.1111/jace.14359⟩. ⟨hal-02263699⟩

  • Communication dans un congrès

An indoor localization technique based on ultra-wideband AoD/AoA/ToA estimation

Brecht Hanssens, David Plets, Emmeric Tanghe, Claude Oestges, Davy Gaillot, M. Lienard, Luc Martens, Wout Joseph

Jjoint 2016 IEEE International Symposium on Antennas and Propagation and URSI/USNC National Radio Science Meeting, AP-S/USNC-URSI 2016, Jun 2016, Fajardo, PR, United States. pp.1445-1446, ⟨10.1109/APS.2016.7696429⟩. ⟨hal-03346251⟩