Publications

Affichage de 9651 à 9660 sur 16106


  • Article dans une revue

Trap characterization in AlGaN/GaN HEMT by analyzing frequency dispersion in capacitance and conductance

L. Semra, A. Telia, A. Soltani

Surface and Interface Analysis, 2010, 42, pp.799-802. ⟨10.1002/sia.3462⟩. ⟨hal-00549910⟩

  • Article dans une revue

Silicon-based micromembranes with piezoelectric actuation and piezoresistive detection for sensing purposes in liquid media

Thomas Alava, Fabrice Mathieu, L. Mazenq, Caroline Soyer, Denis Remiens, Liviu Nicu

Journal of Micromechanics and Microengineering, 2010, 20, pp.075014-1-8. ⟨10.1088/0960-1317/20/7/075014⟩. ⟨hal-00549532⟩

  • Article dans une revue

Micromachining SU-8 pivot structures using AZ photoresist as direct sacrificial layers for a large wing displacement

X.Q. Bao, Thomas Dargent, Eric Cattan

Journal of Micromechanics and Microengineering, 2010, 20, pp.025005-1-13. ⟨10.1088/0960-1317/20/2/025005⟩. ⟨hal-00549518⟩

  • Article dans une revue

Parasitic effects and traps in AlGaN/GaN HEMT on sapphire substrate

O. Fathallah, M. Gassoumi, B. Grimbert, Christophe Gaquière, H. Maaref

European Physical Journal: Applied Physics, 2010, 51, pp.10304-1-5. ⟨10.1051/epjap/2010085⟩. ⟨hal-00549476⟩

  • Communication dans un congrès

Millimeter-wave printed antennas on ultrasoft polymer substrate

S. Hage-Ali, Nicolas Tiercelin, P. Coquet, R. Sauleau, L. Le Coq, H. Fujita, Vladimir Preobrazhensky, Philippe Pernod

4th European Conference on Antennas and Propagation, EuCAP'2010, 2010, Barcelone, Spain. pp.1-5. ⟨hal-00549962⟩

  • Article dans une revue

Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, F. Phillipp, P.A. van Aken, N. Reckinger, Emmanuel Dubois

In this paper, we present results of transmission electron microscopy studies on erbium silicide structures fabricated under various thermal conditions. A titanium cap has been used as a protective layer against oxidation during rapid thermal annealing of an erbium layer in a temperature range of…

Journal of Microscopy, 2010, EM 2008 ‐ XIII International Conference on Electron Microscopy, 237 (3), pp.379-383. ⟨10.1111/j.1365-2818.2009.03264.x⟩. ⟨hal-00549623⟩

  • Communication dans un congrès

Time-resolved electron density and OES measurements for studying the surface loss rates of H and Cl atoms in a Cl2-H2 ICP plasma

G. Curley, L. Gatilova, S. Guilet, S. Bouchoule, G. Gogna, N. Sirse, S. Karkari, J.P. Booth

63rd Annual Gaseous Electronics Conference and 7th International Conference on Reactive Plasmas, 2010, Paris, France. TF4-005, 763-764, Hori M. and Graha W.G. (Eds), Japan Society of Applied Physics. ⟨hal-00800895⟩