Publications
Affichage de 12501 à 12510 sur 16173
Analyse physique de transistors HEMTs AlGaN/GaN élaborés avec la technologie field plate
Brahim Benbakhti, Michel Rousseau, J-C Gerbedoen, Jean-Claude de Jaeger
10èmes Journées de la Matière Condensée, Aug 2006, Toulouse, France. ⟨hal-00128165⟩
Evaluation d'une démarche de modélisation d'équipements électroniques automobiles sur un sous-système réaliste
S. Egot, M. Klingler, L. Kone, S. Baranowski, F. Lafon, C. Marot
2006, pp.273-274. ⟨hal-00142609⟩
Optoelectronic switch and memory devices based on polymer functionalized carbon nanotube transistors
J. Borghetti, Vincent Derycke, S. Lenfant, P. Chenevier, A. Filoramo, M. Goffman, D. Vuillaume, J.P. Bourgoin
Trends in NanoTechnologies, TNT2006, 2006, Grenoble, France. ⟨hal-00127137⟩
Conductive nanorods and nanorings designed by supramolecular association of highly Π-conjugated oligomers
O.J. Dautel, F. Serein-Spirau, J.P. Lere-Porte, J.E. Moreau, D. Tondelier, David Guérin, S. Lenfant, D. Vuillaume
The sixth France-Japan Workshop on Nanomaterials, 2006, Sapporo, Japan. ⟨hal-00127114⟩
Charge injection and transport through organic monolayer : some interface problems
D. Vuillaume
Electronic Structure and Processes of Molecular-Based Interfaces, ESPMI 06, 2006, Nagoya, Japan. ⟨hal-00127133⟩
Role of interfaces on the direct tunneling and inelastic tunneling behaviors through metal/alkylsilane/silicon junctions
D. K. Aswal, C. Petit, G. Salace, David Guérin, S. Lenfant, J.V. Yakhmi, D. Vuillaume
Physica Status Solidi A (applications and materials science), 2006, 203, pp.1464-1469. ⟨hal-00127111⟩
Behavior of a traveling-wave amplifier versus temperature in SOI technology
M. Si Moussa, C. Pavageau, P. Simon, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanhoenacker-Janvier
IEEE Transactions on Microwave Theory and Techniques, 2006, 54, pp.2675-2683. ⟨hal-00126520⟩
Compact-modeling solutions for nanoscale double-gate and gate-all-around MOSFETs
B. Iniguez, T.A. Fjeldly, A. Lazaro, Francois Danneville, M.J. Deen
IEEE Transactions on Electron Devices, 2006, 53, pp.2128-2142. ⟨hal-00126518⟩
A microscopic interpretation of the RF noise performance of fabricated FDSOI MOSFETs
R. Rengel, M.J. Martin, T. Gonzalez, J. Mateos, D. Pardo, Gilles Dambrine, J.P. Raskin, Francois Danneville
IEEE Transactions on Electron Devices, 2006, 53, pp.523-532. ⟨hal-00126521⟩
Contribution à la caractérisation des revêtements par inversion des réponses V(z)
L. Vandevoorde
2006. ⟨hal-00138940⟩