Publications

Affichage de 13171 à 13180 sur 16062


  • COMM

Electronic properties of molecular nanostructures

D. Vuillaume

Nanotech 2005, Japan-France Workshop on Nanosciences and Nanotechnologies, 2005, Tokyo, Japan. ⟨hal-00125615⟩

  • COMM

Apodized filters on InP-material ridge waveguides using sampled Bragg gratings

S. Garidel, Jean-Pierre Vilcot, Didier Decoster

2005, pp.121. ⟨hal-00130829⟩

  • ART

Resonating piezoelectric membranes for microelectromechanically based bioassay: detection of streptavidin–gold nanoparticles interaction with biotinylated DNA

Liviu Nicu, M. Guirardel, F. Chambosse, P. Rougerie, S. Hinh, E. Trevisiol, J.M. Francois, Jean Pierre Majoral, A.M. Caminade, Eric Cattan, C. Bergaud

Sensors and Actuators B: Chemical, 2005, 110, pp.125-136. ⟨hal-00130821⟩

  • COMM

Optical summation of microwave signals

G. Ulliac, N. Breuil, C. Fourdin, P. Nicole, Jean-Pierre Vilcot, Didier Decoster, J. Chazelas

NEFERTITI Workshop on Millimetre Wave Photonic Devices and Technologies for Wireless and Imaging Applications, 2005, Bruxelles, Belgium. ⟨hal-00130838⟩

  • COMM

Effet du désordre dans un démultiplexeur nanométrique plasmonique

Maxime Beaugeois, Abdellatif Akjouj, Bahram Djafari-Rouhani, Jerome O. Vasseur, Yan Pennec, Mohamed Bouazaoui, Jean-Pierre Vilcot, Sophie Maricot, J.P. Vigneron, L. Dobrzynski

Congrès Général de la Société Française de Physique et de la Belgian Physical Society, Aug 2005, Lille, France. ⟨hal-00130845⟩

  • COMM

MicroRaman analysis of resistance ohmic contact to n-AlGaN/GaN

A. Soltani, S. Touati, Virginie Hoel, Jean-Claude de Jaeger, J. Laureyns, Y. Cordier, C. Marhic, A. Djouadi, C. Dua

Proceedings of the 16th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides, Diamond 2005, 2005, Toulouse, France. ⟨hal-00131350⟩

  • COMM

SU-8 based arch-like microfluidic microchannels using single mask/single step photolithography

M. Gaudet, S. Arscott, J.C. Camart, L. Buchaillot

2005, pp.1189-1192. ⟨hal-00130826⟩

  • COMM

MEMS reliability : metrology set-up for investigation of fatigue causes

O. Millet, O. Blanrue, Bernard Legrand, D. Collard, L. Buchaillot

2005, pp.483-486. ⟨hal-00125627⟩

  • COMM

Empirical MOSFET modelling for RF circuit design

A. Siligaris, Gilles Dambrine, F. Sischka, Francois Danneville

2005, 4 pp. ⟨hal-00147493⟩