Publications

Affichage de 13531 à 13540 sur 16170


  • Article dans une revue

Design and optimization of a 1.3/1.55-µm wavelength selective p-i-n photodiode based on multimode diluted waveguide

V. Magnin, L. Giraudet, Joseph Harari, Didier Decoster

IEEE Photonics Technology Letters, 2005, 17, pp.459-461. ⟨hal-00125655⟩

  • Communication dans un congrès

High Accuracy 65nm OPC Verification: Full Process Window Model vs. Critical Failure ORC

Amandine Borjon, Jerome Belledent, Shumay D. Shang, Olivier Toublan, Corinne Miramond, Kyle Patterson, Kevin Lucas, Christophe Couderc, Yves Rody, Frank Sundermann, Jean-Christophe Urbani, Stanislas Baron, Yorick Trouiller, Patrick Schiavone

It is becoming more and more difficult to ensure robust patterning after OPC due to the continuous reduction of layout dimensions and diminishing process windows associated with each successive lithographic generation. Lithographers must guarantee high imaging fidelity throughout the entire range…

2005, pp.1750-1761. ⟨hal-00023223⟩

  • Article dans une revue

8-GHz bandwidth spatial sampling modules for ultrafast random-signal analysis

N. Rolland, A. Benlarbi-Delai, A. Ghis, P.A. Rolland

Microwave and Optical Technology Letters, 2005, 44, pp.292-295. ⟨hal-00154904⟩

  • Communication dans un congrès

A DCT-domain postprocessor for color bleeding removal

François-Xavier Coudoux, Marc G. Gazalet, Patrick Corlay

2005, pp.I-209. ⟨hal-00131105⟩

  • Communication dans un congrès

Design of an ultrasonic system for the online detection of foreign bodies embedded in viscoelastic media

Georges Nassar, Wei-Jiang Xu, Bertrand Nongaillard, Liévin Camus

Proceedings of the 2005 Joint World Congress on Ultrasonics/Ultrasonics International, WCU/UI'05, 2005, Beijing, China. ⟨hal-00140798⟩

  • Communication dans un congrès

Transmission electron microscopy study of erbium silicide formation using a Pt/Er stack on a thin silicon-on-insulator substrate

A. Łaszcz, J. Katcki, J. Ratajczak, Xing Tang, Emmanuel Dubois

Proceedings of the XII International Conference on Electron Microscopy of Solids, EM'2005, 2005, Kazimierz Dolny, Poland. ⟨hal-00139246⟩

  • Article dans une revue

Thermal and electrostatic reliability characterization in RF MEMS switches

Q.H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, Patrick Pons, F. Flourens, F. Pressecq

Microelectronics Reliability, 2005, 45, pp.1790-1793. ⟨hal-00154911⟩