Publications

Affichage de 15561 à 15570 sur 16175


  • Article dans une revue

Determination of electromagnetic disruptions due to the probe receiver used for the measurement of the power deposition of microwave applicators for microwave thermotherapy

J.C. Camart, A. Dietsch, D. Despretz, M. Chive, J. Pribetich

Microwave and Optical Technology Letters, 2000, 25, pp.168-172. ⟨hal-00158133⟩

  • Article dans une revue

Evaluation of niobium effects on the longitudinal piezoelectric coefficients of Pb(Zr, Ti)O-3 thin films

T. Haccart, Eric Cattan, Denis Remiens, S. Hiboux, P. Muralt

Applied Physics Letters, 2000, 76, pp.3292-3294. ⟨hal-00158542⟩

  • Communication dans un congrès

Microsystème : enjeux et perspectives

D. Collard, L. Buchaillot, Bernard Legrand

Journée IMAPS : International Microelectronics and Packaging Society, 2000, Lille, France. ⟨hal-00158539⟩

  • Article dans une revue

Simultaneous generation of longitudinal and shear bulk ultrasonic waves in solids

Jean-Michel Rouvaen, Atika Rivenq, P. Logette, Philippe Goutin, F. Haine

Journal of Physics D: Applied Physics, 2000, 33, pp.1287-1297. ⟨hal-00159053⟩

  • Article dans une revue

Study in a UHF electromagnetic resonant cavity of a bubble field induced by ultrasonic cavitation

S. Labouret, J. Frohly

European Physical Journal: Applied Physics, 2000, 10, pp.231-237. ⟨hal-00159067⟩

  • Communication dans un congrès

Effects of substrate preparation on properties of YBaCuO thin films

A. Dégardin, X. Castel, M. Achani, Maryline Guilloux-Viry, E. Caristan, Yannick Roelens, J.C. Carru, A. Perrin, A. Kreisler

2000, pp.1993-1994. ⟨hal-00157906⟩

  • Article dans une revue

The indium content in metamorphic InAlAs/InGaAs HEMTs on GaAs substrate : a new structure parameter

S. Bollaert, Y. Cordier, M. Zaknoune, H. Happy, Virginie Hoel, Sylvie Lepilliet, D. Theron, A. Cappy

Solid-State Electronics, 2000, 44, pp.1021-1027. ⟨hal-00157879⟩

  • Article dans une revue

An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs

J.S. Goo, C.H. Choi, Francois Danneville, E. Morifuji, H.S. Momose, Z. Yu, H. Iwai, T.H. Lee, R.W. Dutton

IEEE Transactions on Electron Devices, 2000, 47, pp.2410-2419. ⟨hal-00157860⟩