Publications
Affichage de 15641 à 15650 sur 16174
Growth of strained Ga1-xInxP layers on GaP (001) by gas source molecular beam epitaxy : similarities and differences with the growth of strained arsenides
X. Wallart, D. Deresmes, F. Mollot
2000, pp.255-259. ⟨hal-00158443⟩
Croissance d'alliages GaInP contraints par épitaxie à jets moléculaires à sources gazeuses
X. Wallart, C. Priester, D. Deresmes, F. Mollot
13ème Séminaire National sur l'Epitaxie par Jets Moléculaires, EJM 2000, 2000, Saint Aygulf, France. ⟨hal-00158441⟩
La spectroscopie STM : application à l'étude de molécules organiques sur silicium ou de défauts ponctuels dans les semi-conducteurs
D. Stievenard
Journée Surfaces et Interfaces, JSI 2000, 2000, Paris, France. ⟨hal-00158965⟩
New step tunable 2-sections (FP/SG-DFB) semiconductor laser for DWDM applications
M.H. Mourad, Jean-Pierre Vilcot, D. Marcenac, Didier Decoster
1st International Conference on Laser Optics for Young Scientists, LOYS 2000, 2000, Saint Petersbourg, Russia. ⟨hal-00158624⟩
Imaging the wave function amplitudes in cleaved semiconductor quantum boxes
B. Grandidier, Y.M. Niquet, Bernard Legrand, J.P. Nys, C. Priester, D. Stievenard, J.M. Gerard, V. Thierry-Mieg
Physical Review Letters, 2000, 85, pp.1068-1071. ⟨hal-00158644⟩
Lamb wave and plate mode in ZnO/silicon and AlN/silicon membrane - Application to sensors able to operate in contact with liquid
T. Laurent, F.O. Bastien, J.C. Pommier, A. Cachard, Denis Remiens, Eric Cattan
Sensors and Actuators A: Physical , 2000, 87, pp.26-37. ⟨hal-00158554⟩
Harmonic C-scan imaging by means of nonlinear finite amplitude phase conjugate ultrasonic waves
Y. Pyl'Nov, Philippe Pernod, Vladimir Preobrazhensky
2000, pp.835-838. ⟨hal-00158462⟩
Numerical determination of pole shape influence on radial forces in an automative alternator
M. Hecquet, S. Dahel, M. Goueygou, P. Brochet
2nd International Seminar on Vibrations and Acoustic Noise of Electric Machinery, 2000, Lodz, Poland. ⟨hal-00158459⟩
Nature of impurity states in amorphous silicon
Guy Allan, Christophe Delerue, Michel Lannoo
CECAM Workshop on Electronic and Optical Properties of Semiconducting Glasses, 2000, Lyon, France. ⟨hal-00158966⟩