Publications

Affichage de 2841 à 2850 sur 15871


  • Chapitre d'ouvrage

2 - Closed loop

L. Dobrzynski, Housni Al Wahsh, Abdellatif Akjouj, El Houssaine El Boudouti, Cécile Ghouila-Houri, Abdelkrim Talbi, Gaëtan Lévêque, Bahram Djafari-Rouhani

A closed loop can be obtained by linear superposition of the two free ends of an open loop. Its main property is the double degeneracy of its states. The analytical expressions of its eigenvalues, eigenfunctions, and response function are presented. The case of two simultaneous identical measures…

Photonics, Part one: photonic paths, Elsevier, pp.15-19, 2021, 978-0-12-819388-4. ⟨10.1016/B978-0-12-819388-4.00011-3⟩. ⟨hal-03350752⟩

  • Article dans une revue

Piezoresistance in defect-engineered silicon

Heng Li, Abel Thayil, Chris Lew, Marcel Filoche, Brett Johnson, Jeff Mccallum, S. Arscott, Alistair C. H. Rowe

The steady-state, space-charge-limited piezoresistance (PZR) of defect-engineered, silicon-on-insulator device layers containing silicon divacancy defects changes sign as a function of applied bias. Above a punch-through voltage (Vt) corresponding to the onset of a space-charge-limited hole current…

Physical Review Applied, 2021, 15 (1), 014046, 9 p. ⟨10.1103/PhysRevApplied.15.014046⟩. ⟨hal-03003310⟩

  • Communication dans un congrès

Polydimethylsiloxane micro-channels application for the study of dynamic wetting of nano-etched silicon surfaces based on acoustic characterization method

Abbas Salhab, Julien Carlier, Pierre Campistron, M. Neyens, Malika Toubal, Bertrand Nongaillard, V. Thomy

Efficient cleaning of contaminations in the semiconductor industry is a determining factor in ensuring the good quality of the electronics products. We present here the dynamic wetting characterization of a fluid on top of Deep Trench Isolation (DTI) structures using ultra-high frequency acoustic…

15th International Symposium on Ultra Clean Processing of Semiconductor Surfaces, UCPSS 2021, Session 6 - Wet processing in narrow spaces and pattern collapse, Apr 2021, Virtual, Unknown Region. pp.143-149, ⟨10.4028/www.scientific.net/SSP.314.143⟩. ⟨hal-03362264⟩

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