Publications

Affichage de 14051 à 14060 sur 16059


  • COUV

Characterization of surface cracks in metals by microwave techniques

D. Glay, T. Lasri

GREEN R.E. JR., DJORDJEVIC B.B., HENTSCHEL M.P. Nondestructive characterization of materials XI, Springer Verlag, pp.345-352, 2003. ⟨hal-00132310⟩

  • COMM

Les Interconnexions cuivre sont-elles un verrou technologique majeir pour les circuits ULSI du futur utilisant la technologie ultime ? Analyse électromagnétique et performances

K. El Bouazzati, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht

Telecom et JFMMA, 2003, Marrakech, Maroc. ⟨lirmm-00269827⟩

  • COMM

Sub 0.1 µm – InP based HEMTs for high power and high frequency

D. Theron, F Medjdoub, M. Zaknoune, X. Wallart, F. Dessenne, R. Fauquembergue, Jean-Claude de Jaeger

Workshop on Compound Semiconductor Materials and Devices, WOCSEMMAD 2003, 2003, Atlanta, GA, United States. ⟨hal-00146719⟩

  • ART

Realization of waveguiding epitaxial GaN layers on Si by low-pressure metalorganic vapor phase epitaxy

H.P.D. Schenk, E. Feltin, M. Laugt, O. Tottereau, P. Vennegues, El Hadj Dogheche

Applied Physics Letters, 2003, 83, pp.5139-5141. ⟨hal-00162728⟩

  • COMM

Modélisation d'Interconnexions Cuivre Submicroniques VLSI en Présence des Niveaux Environnants à Pertes

K. El Bouazzatti, Jean-François Legier, Erick Paleczny, Christophe Seguinot, Denis Deschacht

13èmes Journées Nationales Microondes, May 2003, Lille, France. ⟨lirmm-00269550⟩

  • ART

Low frequency drain noise comparison of AlGaN/GaN HEMTs grown on silicon, SiC and sapphire substrates

A. Curutchet, N. Malbert, N. Touboul, Christophe Gaquière, A. Minko, M. Uren

Microelectronics Reliability, 2003, 43, pp.1713-1718. ⟨hal-00146665⟩

  • ART

About the measurements of the d33 piezoelectric coefficient of the PZT film-Si/SiO2/Ti/Pt substrates using an optical cryostat

J. Nosek, L. Burianova, M. Sulc, Caroline Soyer, Eric Cattan, Denis Remiens

Ferroelectrics, 2003, 292, pp.103-109. ⟨hal-00146464⟩