Publications

Affichage de 14691 à 14700 sur 16106


  • Article dans une revue

Design and simulation of a two-section Fabry-Perot sampled grating distributed bragg reflector laser for dense wavelength-division multiplexing applications

M.H. Mourad, D. Marcenac, Jean-Pierre Vilcot, Didier Decoster

Optical Engineering, 2002, 41, pp.479-483. ⟨hal-00149622⟩

  • Article dans une revue

Vacuum and cryogenic station for Micro-Electro-Mechanical Systems probing and testing

Bernard Legrand, E. Quévy, B. Stefanelli, D. Collard, L. Buchaillot

Review of Scientific Instruments, 2002, 73, pp.4393-4395. ⟨hal-00148782⟩

  • Communication dans un congrès

Monte Carlo study of the breakdown of an AlInAs/GaInAs HEMT on InP with an InP etch stop layer

F Medjdoub, D. Theron, F. Dessenne, R. Fauquembergue, Jean-Claude de Jaeger

2002, pp.57-62. ⟨hal-00149710⟩

  • Article dans une revue

Fabrication of a pMUT using silicon bulk micromachining and a sputtered PZT layer

W. Daniau, Karim Dogheche, S. Ballandras, Eric Cattan, Denis Remiens, W. Steichen, P. Blind

Proc. of the 2nd WorkShop on MUT, Besançon, 2002, pp. june. ⟨hal-00123195⟩

  • Article dans une revue

Fast electromagnetic characterization method of film-shaped materials using coplanar up to V-band

J. Hinojosa, K. Lmimouni, Gilles Dambrine

Electronics Letters, 2002, 38, pp.373-374. ⟨hal-00147838⟩

  • Communication dans un congrès

Solid-state 8 GHz transient signal digitizer characterization

A. Ghis, P. Ouvrier-Buffet, N. Rolland, A. Benlarbi-Delai, P.A. Rolland, D. Glay, D. Jaeger

2002, pp.1673-1676. ⟨hal-00148329⟩

  • Communication dans un congrès

Modélisation numérique et caractérisation expérimentale du champ de cavitation ultrasonore

P. Mosbah, Bertrand Dubus, O. Ledez, C. Campos-Pozuelo, C. Granger

2002, pp.747-750. ⟨hal-00147777⟩

  • Communication dans un congrès

Matching of ultrasonic transducer : interest of the glue layer

Dorothée Debavelaere-Callens, C. Bruneel, Jamal Assaad

2002, pp.2408. ⟨hal-00149910⟩

  • Communication dans un congrès

Reliability of packaging MEMS in shock environment : crack and stiction modeling

O. Millet, D. Collard, L. Buchaillot

2002, pp.696-703. ⟨hal-00148789⟩

  • Communication dans un congrès

Grazing incidence diffraction anomalous fine structure of self-assembled semiconductor nanostructures

S. Grenier, A. Letoublon, M.G. Proietti, Hubert Renevier, L. Gonzalez, J.M. Garcia, C. Priester, J. Garcia

2002, pp.24-33. ⟨hal-00149685⟩