Publications
Affichage de 13591 à 13600 sur 16170
Fuzzy logic modelling of electrical properties – PANI/Dyneema® conductive fibres
B. Kim, V. Koncar, C. Dufour
5th World Textile Conference, AUTEX 2005, 2005, Portorož, Slovenia. ⟨hal-00247654⟩
Etude phénoménologique du couplage d'un connecteur blindé installé sur circuit imprimé
Youssef Bouri
GDR ONDES - Assemblée Générale : Interférences d'Ondes, Nov 2005, Besançon, France. pp.151-152. ⟨hal-00247721⟩
Design and optimization of a 1.3/1.55-µm wavelength selective p-i-n photodiode based on multimode diluted waveguide
V. Magnin, L. Giraudet, Joseph Harari, Didier Decoster
IEEE Photonics Technology Letters, 2005, 17, pp.459-461. ⟨hal-00125655⟩
High Accuracy 65nm OPC Verification: Full Process Window Model vs. Critical Failure ORC
Amandine Borjon, Jerome Belledent, Shumay D. Shang, Olivier Toublan, Corinne Miramond, Kyle Patterson, Kevin Lucas, Christophe Couderc, Yves Rody, Frank Sundermann, Jean-Christophe Urbani, Stanislas Baron, Yorick Trouiller, Patrick Schiavone
2005, pp.1750-1761. ⟨hal-00023223⟩
8-GHz bandwidth spatial sampling modules for ultrafast random-signal analysis
N. Rolland, A. Benlarbi-Delai, A. Ghis, P.A. Rolland
Microwave and Optical Technology Letters, 2005, 44, pp.292-295. ⟨hal-00154904⟩
A DCT-domain postprocessor for color bleeding removal
François-Xavier Coudoux, Marc G. Gazalet, Patrick Corlay
2005, pp.I-209. ⟨hal-00131105⟩
Design of an ultrasonic system for the online detection of foreign bodies embedded in viscoelastic media
Georges Nassar, Wei-Jiang Xu, Bertrand Nongaillard, Liévin Camus
Proceedings of the 2005 Joint World Congress on Ultrasonics/Ultrasonics International, WCU/UI'05, 2005, Beijing, China. ⟨hal-00140798⟩
Transmission electron microscopy study of erbium silicide formation using a Pt/Er stack on a thin silicon-on-insulator substrate
A. Łaszcz, J. Katcki, J. Ratajczak, Xing Tang, Emmanuel Dubois
Proceedings of the XII International Conference on Electron Microscopy of Solids, EM'2005, 2005, Kazimierz Dolny, Poland. ⟨hal-00139246⟩
Thermal and electrostatic reliability characterization in RF MEMS switches
Q.H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, Patrick Pons, F. Flourens, F. Pressecq
Microelectronics Reliability, 2005, 45, pp.1790-1793. ⟨hal-00154911⟩