Publications

• Communication dans un congrès

Electronic properties of molecular nanostructures

D. Vuillaume

Solid-State Physics Symposium, 2005, Mumbai, India. ⟨hal-00125616⟩

• Article dans une revue

Design and optimization of a 1.3/1.55-µm wavelength selective p-i-n photodiode based on multimode diluted waveguide

V. Magnin, L. Giraudet, Joseph Harari, Didier Decoster

IEEE Photonics Technology Letters, 2005, 17, pp.459-461. ⟨hal-00125655⟩

• Article dans une revue

Benzocyclobutene wafer bonding for III-V nanophotonic guiding structures

D. Lauvernier, Jean-Pierre Vilcot, S. Garidel, S. Mc Murtry, Didier Decoster

Electronics Letters, 2005, 41, pp.1170-1172. ⟨hal-00125663⟩

• Communication dans un congrès

Charge injection and transport in a single organic monolayers island

D. Vuillaume

American Physical Society March Meeting, 2005, Los Angeles, CA, United States. ⟨hal-00125614⟩

• Communication dans un congrès

Role of interfaces on the direct tunneling and the inelastic tunneling behaviors through metal/alkylsilane/silicon junctions

D.K. Aswal, C. Petit, G. Salace, David Guérin, S. Lenfant, J.V. Yakhmi, D. Vuillaume

Trends in NanoTechnology, TNT 2005, 2005, Oviedo, Spain. ⟨hal-00125602⟩

• Communication dans un congrès

Pentacene thin film transistors on self-assembled monolayers gate dielectrics

K. Lmimouni, R. Bianchini, S. Lenfant, David Troadec, D. Vuillaume

ElecMol'05, 2005, Grenoble, France. ⟨hal-00125605⟩

• Article dans une revue

Behavior of a common source traveling wave amplifier versus temperature in SOI technology

M. Si Moussa, C. Pavageau, P. Simon, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanoenacker-Janvier

EuMA - Journal of the European Microwave Association, 2005, 1, pp.288-292. ⟨hal-00125165⟩

• Communication dans un congrès

Origin and control of spurious Lamb wave resonances in Bulk Acoustic Wave (BAW) resonators

A. Volatier, C. Pigot, P. Ancey, Bertrand Dubus

WCU/UI'05 Joint Conference, 2005, Beijing, China. ⟨hal-00124962⟩

• Communication dans un congrès

Electric force microscopy of individually charged silicon nanoparticles

Thierry Melin, Heinrich Diesinger, Sophie Barbet, D. Deresmes, T. Baron., Didier Stiévenard

We report on charge injection experiments performed on single silicon nanoparticles and their analysis by Electric Force Microscopy (EFM). An analytical model is presented, enabling a quantitative determination of the charge state of the semiconductor nanoparticles from EFM signals, for arbitrary…

Materials Research Society 2005 Fall Meeting, Nov 2005, Boston, MA, United States. ⟨hal-00126439⟩

• Article dans une revue

Molecular interactions of PTCDA on Si(100)

T. Soubiron, Francois Vaurette, J.P. Nys, B. Grandidier, X. Wallart, D. Stievenard

Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2005, 581, pp.178-188. ⟨hal-00126421⟩