Publicaciones

Affichage de 3151 à 3160 sur 5644


  • Proceedings/Recueil des communications

Service Orientation in Holonic and Multi-agent Manufacturing

Theodor Borangiu, Damien Trentesaux, André Thomas, Duncan Mcfarlane

Of interest are recent advances and on-going research in holonic and agent-based systems for manufacturing. Industrials are seeking for models and solutions that are not only able to provide efficient overall production performance, but also to face reactively a growing set of unpredicted events....

2016, Service Orientation in Holonic and Multi-agent Manufacturing, 978-3-319-30335-2. ⟨10.1007/978-3-319-30337-6⟩. ⟨hal-01425754⟩

  • Communication dans un congrès

The ConWip Production Control System: a Literature Review

Yann Jaegler, Patrick Burlat, Samir Lamouri

A growing body of literature dealing with ConWip has been observed during the past decade. Considering the current industrial challenges characterized by adaptability, product customization, shortened lead times and customer satisfaction, ConWip appears to be an effective and adapted production...

The International Conference on Information Systems, Logistics and Supply Chain (ILS International Conference) , KEDGE Business School in Bordeaux, Jun 2016, Bordeaux France. ⟨hal-01350666⟩

  • Communication dans un congrès

A co-design space exploration tool for avionic high performance heterogeneous embedded architectures

Geoffroy Pertuisot, Nicolas Belanger, Yassin El Hillali, Smail Niar, Atika Rivenq

Avionics in the helicopter manufacturers' landscape faces new challenges. Whereas customers raise continuously their needs in terms of new functions and embedded systems performances, certification authorities maintain complex rules to fulfill for parallel computing. This constraining...

11th International Design and Test Symposium, IDT 2016, Dec 2016, Hammamet, Tunisia. pp.77-82, ⟨10.1109/IDT.2016.7843018⟩. ⟨hal-03528686⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate...

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩