Publications

Affichage de 3051 à 3060 sur 5560


  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate…

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩

  • Article dans une revue

Introduction

Flavien Balbo, René Mandiau

Revue des Sciences et Technologies de l'Information - Série RIA : Revue d'Intelligence Artificielle, 2016, Intelligent transport systems, 30 (3), pp.269-270. ⟨hal-03665059⟩