Publications

Affichage de 3131 à 3140 sur 5644


  • Proceedings/Recueil des communications

Service Orientation in Holonic and Multi-agent Manufacturing

Theodor Borangiu, Damien Trentesaux, André Thomas, Duncan Mcfarlane

Of interest are recent advances and on-going research in holonic and agent-based systems for manufacturing. Industrials are seeking for models and solutions that are not only able to provide efficient overall production performance, but also to face reactively a growing set of unpredicted events.…

2016, Service Orientation in Holonic and Multi-agent Manufacturing, 978-3-319-30335-2. ⟨10.1007/978-3-319-30337-6⟩. ⟨hal-01425754⟩

  • Communication dans un congrès

The ConWip Production Control System: a Literature Review

Yann Jaegler, Patrick Burlat, Samir Lamouri

A growing body of literature dealing with ConWip has been observed during the past decade. Considering the current industrial challenges characterized by adaptability, product customization, shortened lead times and customer satisfaction, ConWip appears to be an effective and adapted production…

The International Conference on Information Systems, Logistics and Supply Chain (ILS International Conference) , KEDGE Business School in Bordeaux, Jun 2016, Bordeaux France. ⟨hal-01350666⟩

  • Rapport

Projet SIL, L4. Méthodologie générique d'allocation des SIL aux fonctions de sécurité - Guide d'application

Kiswendsida Abel Ouedraogo, Julie Beugin, El Miloudi El Koursi, Joffrey Clarhaut, Dominique Renaux, Frédéric Lisiecki

Ce livrable L4 présente la méthodologie générique proposée pour l'allocation des SIL aux fonctions de sécurité d'un matériel roulant ferroviaire pour pouvoir répondre aux problématiques d'allocation des SIL souleÎes dans le livrable L2 du projet SIL. Les étapes de la méthodologie…

[Rapport de recherche] IFSTTAR - Institut Français des Sciences et Technologies des Transports, de l'Aménagement et des Réseaux. 2016, 52p. ⟨hal-01463888⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate…

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩