Publications

Affichage de 3051 à 3060 sur 5560


  • Chapitre d'ouvrage

Trois expériences d'apprentissage par les problèmes

Jean-Paul Becar, Jean-Charles Canonne, Fabrice Robert, Eric Cartignies, Aurel Fratu, Mariana Fratu, Désiré Dauphin Rasolomampionona

Le projet : les pratiques en IUT, Contribution au chapitre IV- Articuler l’approche projet et le pilotage institutionnel, L’Harmattan, pp.106-110, 2016, 978-2-343-10803-2. ⟨hal-02508572⟩

  • Article dans une revue

EQUITAS: A tool-chain for functional safety and reliability improvement in automotive systems

Reda Nouacer, Manel Djemal, Smail Niar, Gilles Mouchard, Nicolas Rapin, Jean-Pierre Gallois, Philippe Fiani, François Chastrette, Arnault Lapitre, Toni Adriano, Bryan Mac-Eachen

To support advanced features such as hybrid engine control, intelligent energy management, and advanced driver assistance systems, automotive embedded systems must use advanced technologies. As a result, systems are becoming distributed and include dozens of Electronic Control Units (ECU). On the…

Microprocessors and Microsystems: Embedded Hardware Design , 2016, 47, pp.252-261. ⟨10.1016/j.micpro.2016.07.020⟩. ⟨cea-01845196⟩

  • Article dans une revue

Experimental Study of Heat and Mass Transfer for Liquid Film Evaporation along a Vertical Plate Covered With a Porous Layer

Amine Terzi, Sadok Ben Jabrallah, Souad Harmand

In this paper, we realized an Experimental study of heat and mass transfer for liquid evaporation along a vertical plate covered with a porous layer. To develop this study, an experimental dispositive was realized. To highlight the effect of the addition of a porous layer on the phenomenon of…

Journal of Applied Fluid Mechanics, 2016, Selected papers from the 7thInternational Exergy, Energy and Environment Symposium, IEEE7-2015, 9 (Special issue 1), pp.113-120. ⟨10.36884/jafm.9.SI1.25821⟩. ⟨hal-03447185⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate…

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩

  • Article dans une revue

Introduction

Flavien Balbo, René Mandiau

Revue des Sciences et Technologies de l'Information - Série RIA : Revue d'Intelligence Artificielle, 2016, Intelligent transport systems, 30 (3), pp.269-270. ⟨hal-03665059⟩