Publications

Affichage de 3191 à 3200 sur 5729


  • Chapitre d'ouvrage

Arezzo: an emulator for the bench4star initiative

Thierry Berger, Dominique Deneux, Thérèse Bonte, Etienne Cocquebert, Damien Trentesaux

Fischer X., Daidie A., Eynard B., Paredes M. Research in Interactive Design, 4, Springer, pp. 530-536, 2016, 978-3-319-26119-5. ⟨hal-03406808⟩

  • Article dans une revue

A new reduced model of scavenging to optimize cylinder design

Stéphanie Cagin, Xavier Fischer, Eric Delacourt, Nachida Bourabaa, Céline Morin, Daniel Coutellier, Bertrand Carre, Sylvain Loumé

This paper presents the development of a new scavenging model to optimize cylinder design. The developed model explicitly integrates some of the cylinder’s design and environmental variables to describe flows during the scavenging process. Then, based on the reduced model, an optimization phase was…

SIMULATION: Transactions of The Society for Modeling and Simulation International, 2016, 92 (6), pp.507-520. ⟨10.1177/0037549716644516⟩. ⟨hal-01330975⟩

  • Communication dans un congrès

HCI Engineering Integrated with Capability Maturity Models

Taisa Guidini Gonçalves, Káthia Marçal de Oliveira, Christophe Kolski

Even though coming from different communities, Software Engineering (SE) and Human-Computer Interaction (HCI) engineering have similar goals: the definition of methods, techniques and standards to support the development of software systems, and, in particular for HCI, of interactive systems.…

10th International Conference on Research Challenges in Information Science, IEEE RCIS 2016, Institute of Electrical and Electronics Engineers (IEEE), May 2016, Grenoble, France. pp.633-644, ⟨10.1109/RCIS.2016.7549319⟩. ⟨hal-03350385⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate…

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩