Francois
BERKMANS
-
Bâtiment CISIT
Revue internationale avec comité de lecture
Wieczorowski M., Kurkiewicz A., Bigerelle M., Pereira A., Królczyk G., Berkmans F., Gapinski B. (2026). Determinants and Challenges of Metrology 5.0. Advances in Manufacturing V, pp. 3-16 [DOI=https://doi.org/10.1007/978-3-032-23038-6_1].
Berkmans F., Bartkowiak T., Grochalski K., Wieczorowski M., Bigerelle M. (2026). Curvature-based multiscale feature extraction for surface quality inspection in manufacturing. The International Journal of Advanced Manufacturing Technology, pp. 1-26 [DOI=https://doi.org/10.1007/s00170-025-17145-8].
Moreau C., Lemesle J., Berkmans F., Paez margarit D., Carlier T., Blateyron F., Bigerelle M. (2026). Sdr as a Key Roughness Parameter for Monitoring the Temporal Stability of Measuring Instruments: Short- and Extended-Time Uncertainties. metrology [DOI=https://doi.org/10.3390/metrology6010010].
Berkmans F., Bigerelle M., Lemesle J., Nys L., Wieczorowski M., Brown C. (2025). Peer assessment in interdisciplinary learning: Measuring reliability and engaging critical thinking. Thinking Skills and Creativity, 58, pp. 101950 [DOI=https://doi.org/10.1016/j.tsc.2025.101950].
Mietlinski P., Berkmans F., Peta K., Bartkowiak T., Bigerelle M., Gapinski B., Wieczorowski M. (2025). Multiscale and re-entrant surface analysis of multi jet fusion surfaces and the effect of postprocessing via sandblasting. Scientific Reports [DOI=https://doi.org/10.1038/s41598-025-27015-8].
Bigerelle M., Berkmans F., Lemesle J. (2025). Evaluating the Fractal Pattern of the Von Koch Island Using Richardson's Method. fractal and fractional, 9-8, pp. 483 [DOI=https://doi.org/10.3390/fractalfract9080483].
Berkmans F., Lemesle J., Guibert R., Wieczorowski M., Brown C., Bigerelle M. (2025). Uncertainty-Based Scale Identification and ProcessTopography Interaction Analysis via Bootstrap: Application to Grit Blasting. Fractal and Fractional, 9-1, pp. 48 [DOI=https://doi.org/10.3390/fractalfract9010048].
Berkmans F., Robache F., Mironova A., Nys L., Wieczorowski M., Bigerelle M. (2024). Brushes and brains: Does handedness influence surface topography of art painting?. Measurement, 230, pp. 114521 [DOI=https://doi.org/10.1016/j.measurement.2024.114521].
Berkmans F., Lemesle J., Guibert R., Wieczorowski M., Brown C., Bigerelle M. (2024). Two 3D Fractal-Based Approaches for Topographical Characterization: Richardson Patchwork versus Sdr. Materials, 17-10, pp. 2386 [DOI=https://doi.org/10.3390/ma17102386].
Conférence internationale avec actes et comité de lecture
Berkmans F., Nys L., Wieczorowski M., Bigerelle M. (2024). Surface Topography: An indicator for the Authentication of Painters' artworks. 24th International Conference on Metrology and Properties of Surfaces (Met&Props), Marrakech, Maroc, mai .