Publications

Affichage de 3641 à 3650 sur 5525


  • ART

Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

Lorenzo Mancini, Nooshin Amirifar, Deodatta Shinde, Ivan Blum, Matthieu Gilbert, Angela Vella, François Vurpillot, Williams Lefebvre, Rodrigue Lardé, Etienne Talbot, Philippe Pareige, Xavier Portier, Ahmed Ziani, Christian Davesnne, Christophe Durand, Joël Eymery, Raphaël Butté, Jean-François Carlin, Nicolas Grandjean, Lorenzo Rigutti

Atom probe tomography allows for three-dimensional reconstruction of the elemental distribution in materials at the nanoscale. However, the measurement of the chemical composition of compound semiconductors may exhibit strong biases depending on the experimental parameters used. This article…

Journal of Physical Chemistry C, 2014, 118 (41), pp.24136-24151. ⟨10.1021/jp5071264⟩. ⟨hal-01163403⟩