Publicaciones

Affichage de 3051 à 3060 sur 5559


  • Communication dans un congrès

A dynamic hybrid control architecture for sustainable manufacturing control

José-Fernando Jimenez Gordillo, Abdelghani Bekrar, Adriana Giret, Paulo Leitão, Damien Trentesaux

Manufacturing systems face the challenge of accomplishing the productive effectiveness and sustainable efficiency goals at operational level. For this, manufacturing control systems must incorporate a mechanism that balances the trade-off between effectiveness and efficiency in perturbed scenarios...

12th IFAC Workshop on Intelligent Manufacturing Systems IMS 2016, Dec 2016, Austin, Texas, United States. pp.114-119, ⟨10.1016/j.ifacol.2016.12.171⟩. ⟨hal-03416117⟩

  • Communication dans un congrès

Counterpart of Advanced TS discrete controller without matrix inversion

Thomas Laurain, Jimmy Lauber, Reinaldo Martinez Palhares

This paper aims to present a systematic methodology for designing a Counterpart of an Advanced Takagi-Sugeno (CATS) discrete controller. Advance controllers for nonlinear systems under Takagi-Sugeno representation have been designed for years using efficient control laws such as the non-PDC (...

4th IFAC Conference on Intelligent Control and Automation Sciences ICONS 2016, Jun 2016, Reims, France. pp.182-187, ⟨10.1016/j.ifacol.2016.07.110⟩. ⟨hal-03406949⟩

  • Communication dans un congrès

A co-design space exploration tool for avionic high performance heterogeneous embedded architectures

Geoffroy Pertuisot, Nicolas Belanger, Yassin El Hillali, Smail Niar, Atika Rivenq

Avionics in the helicopter manufacturers' landscape faces new challenges. Whereas customers raise continuously their needs in terms of new functions and embedded systems performances, certification authorities maintain complex rules to fulfill for parallel computing. This constraining...

11th International Design and Test Symposium, IDT 2016, Dec 2016, Hammamet, Tunisia. pp.77-82, ⟨10.1109/IDT.2016.7843018⟩. ⟨hal-03528686⟩

  • Communication dans un congrès

Modeling transistor level masking of soft errors in combinational circuits

Ihsen Alouani, Smail Niar, Yassin El Hillali, Atika Rivenq

Technology scaling in modern electronic circuits shrinks the transistor size and dramatically increases the sensitivity of semiconductor devices to radiations. Consequently, soft errors emerged as a serious reliability threat in both sequential and combinational circuits. To accurately estimate...

2015 IEEE East-West Design and Test Symposium, EWDTS 2015, Sep 2015, Batumi, United States. pp.7493140, ⟨10.1109/EWDTS.2015.7493140⟩. ⟨hal-03528693⟩

  • Article dans une revue

Introduction

Flavien Balbo, René Mandiau

Revue des Sciences et Technologies de l'Information - Série RIA : Revue d'Intelligence Artificielle, 2016, Intelligent transport systems, 30 (3), pp.269-270. ⟨hal-03665059⟩